SEMICONDUCTOR UNIT OF SiP TYPE

PROBLEM TO BE SOLVED: To provide a semiconductor unit capable of reducing the number of pins in a package, capable of compatifying a size, and capable of enhancing concurrently controllability and observability, in the semiconductor device of an SiP type. SOLUTION: The first semiconductor device is...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	OCHI NAOYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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