TESTING DEVICE AND TESTING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To enable test of a tested circuit such as a memory or an analog circuit that cannot be scanned, an input/output circuit, and a signal line between the input/output circuit and tested circuit. SOLUTION: A test device 1 of a semiconductor integrated circuit comprises the input/o...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KAMATA TETSUO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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