QUALITY INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide a quality inspection device capable of inspecting a defect such as a printing error or a dirt accurately before processing by a slotter unit or a die cutter unit on a printing line. SOLUTION: The interval of an aperture S between at least one pair of adjacent two uni...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	HIGUCHI YASUTAKA, HIKAMI YOSHITAKA, KANEKAWA MASATO
Format:	Patent
Sprache:	eng
Schlagworte:	CONVEYING HANDLING THIN OR FILAMENTARY MATERIAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MACHINES, APPARATUS OR DEVICES FOR, OR METHODS OF, PACKAGINGARTICLES OR MATERIALS MEASURING PACKING PERFORMING OPERATIONS PHYSICS STORING TESTING TRANSPORTING UNPACKING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a quality inspection device capable of inspecting a defect such as a printing error or a dirt accurately before processing by a slotter unit or a die cutter unit on a printing line. SOLUTION: The interval of an aperture S between at least one pair of adjacent two units between a printing unit, the slotter unit and the die cutter unit constituting the printing line L is set to be variable. An illumination means 2 for illuminating a corrugated cardboard sheet 5 conveyed through the aperture S is provided inside the aperture S, and an imaging means 3 for imaging an inspection surface 50 is provided outside the aperture S, and a determination means 4 for determining existence of a defect on the inspection surface 50 based on the output from the imaging means 3 is provided. COPYRIGHT: (C)2006,JPO&NCIPI