SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

PROBLEM TO BE SOLVED: To inexpensively manufacture a semiconductor device having copper wiring on which a MIM capacitance element is formed. SOLUTION: An additional interlayer film 26 is formed between a copper diffusion preventing film 14 on the copper wiring 22 and a lower electrode 27 of the MIM...

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Bibliographische Detailangaben
1. Verfasser: MIZUMURA AKIRA
Format: Patent
Sprache:eng
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