BURN-IN APPARATUS FOR SEMICONDUCTOR LASER DEVICE

BURN-IN APPARATUS FOR SEMICONDUCTOR LASER DEVICE

PROBLEM TO BE SOLVED: To provide a burn-in apparatus for a semiconductor laser device, where a tray is detachable from a housing and which accurately sets the temperature, in the vicinity of a product during burn-in to stabilize the temperature characteristics. SOLUTION: The burn-in apparatus for co...

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Hauptverfasser: OMIZU YOSHIHARU, SHIGEKAWA YASUSHI
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
DEVICES USING STIMULATED EMISSION
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator OMIZU YOSHIHARU
SHIGEKAWA YASUSHI
description PROBLEM TO BE SOLVED: To provide a burn-in apparatus for a semiconductor laser device, where a tray is detachable from a housing and which accurately sets the temperature, in the vicinity of a product during burn-in to stabilize the temperature characteristics. SOLUTION: The burn-in apparatus for conducting temperature test for a plurality of semiconductor laser devices comprises a product tray 2, to which a plurality of semiconductor laser devices to be testes are attached, a temperature control means 4 which is installed on the undersurface of the product tray 2 via a thermal conductive elastic sheet 3 to set the semiconductor device 1 at a predetermined temperature, and a thermistor 6 for measuring the temperature of the product tray 2. The product tray 2 and the temperature control means 4 are detachable, and on the basis of the temperature measured by the thermistor 6, the temperature control means 4 corresponding to the temperature control of each semiconductor laser device 1 is controlled. COPYRIGHT: (C)2006,JPO&NCIPI
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SOLUTION: The burn-in apparatus for conducting temperature test for a plurality of semiconductor laser devices comprises a product tray 2, to which a plurality of semiconductor laser devices to be testes are attached, a temperature control means 4 which is installed on the undersurface of the product tray 2 via a thermal conductive elastic sheet 3 to set the semiconductor device 1 at a predetermined temperature, and a thermistor 6 for measuring the temperature of the product tray 2. The product tray 2 and the temperature control means 4 are detachable, and on the basis of the temperature measured by the thermistor 6, the temperature control means 4 corresponding to the temperature control of each semiconductor laser device 1 is controlled. 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subjects BASIC ELECTRIC ELEMENTS
DEVICES USING STIMULATED EMISSION
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title BURN-IN APPARATUS FOR SEMICONDUCTOR LASER DEVICE
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