SYSTEM FOR DETECTING STRUCTURAL DEFECTS AND FEATURES BY USING BLACK-BODY RADIATION
PROBLEM TO BE SOLVED: To provide a system which uses back-body radiation to detect the defects of covering objects. SOLUTION: This is the system which utilizes temperature of a covering object nearly in stable state, in cooperation with an optical inspection system to selectively find defects and ch...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | CHU STEVEN WEIR JOHN DOUGLAS SILBERSTEIN ROBERT P DIMARZIO DONALD |
| description | PROBLEM TO BE SOLVED: To provide a system which uses back-body radiation to detect the defects of covering objects. SOLUTION: This is the system which utilizes temperature of a covering object nearly in stable state, in cooperation with an optical inspection system to selectively find defects and characteristics of the object through its covering, without the need for temporary heating, that is, infrared irradiation and reflective imaging. In the system, an optical tester such as infrared camera can be matched with to the wavelength making the covering material approximately transparent, thereby its defects and characteristics can be found clearly at maximum, to distinguish between false characteristics on surface of the covering and true defects and characteristics. Thus this invented system enables inspection of small area or large area in real time, without the need for any complicated image acquisition/storage means, image processing device and software. COPYRIGHT: (C)2006,JPO&NCIPI |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2006119134A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2006119134A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2006119134A3</originalsourceid><addsrcrecordid>eNrjZAgKjgwOcfVVcPMPUnBxDXF1DvH0c1cIDgkKdQ4JDXL0AQq6AQWDFRz9XBTcXB2Bgq7BCk6RCqHBIIVOPo7O3rpO_i6RCkGOLp6OIZ7-fjwMrGmJOcWpvFCam0HJzTXE2UM3tSA_PrW4IDE5NS-1JN4rwMjAwMzQ0NLQ2MTRmChFADkhMAM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM FOR DETECTING STRUCTURAL DEFECTS AND FEATURES BY USING BLACK-BODY RADIATION</title><source>esp@cenet</source><creator>CHU STEVEN ; WEIR JOHN DOUGLAS ; SILBERSTEIN ROBERT P ; DIMARZIO DONALD</creator><creatorcontrib>CHU STEVEN ; WEIR JOHN DOUGLAS ; SILBERSTEIN ROBERT P ; DIMARZIO DONALD</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a system which uses back-body radiation to detect the defects of covering objects. SOLUTION: This is the system which utilizes temperature of a covering object nearly in stable state, in cooperation with an optical inspection system to selectively find defects and characteristics of the object through its covering, without the need for temporary heating, that is, infrared irradiation and reflective imaging. In the system, an optical tester such as infrared camera can be matched with to the wavelength making the covering material approximately transparent, thereby its defects and characteristics can be found clearly at maximum, to distinguish between false characteristics on surface of the covering and true defects and characteristics. Thus this invented system enables inspection of small area or large area in real time, without the need for any complicated image acquisition/storage means, image processing device and software. COPYRIGHT: (C)2006,JPO&NCIPI</description><language>eng</language><subject>COLORIMETRY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060511&DB=EPODOC&CC=JP&NR=2006119134A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060511&DB=EPODOC&CC=JP&NR=2006119134A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHU STEVEN</creatorcontrib><creatorcontrib>WEIR JOHN DOUGLAS</creatorcontrib><creatorcontrib>SILBERSTEIN ROBERT P</creatorcontrib><creatorcontrib>DIMARZIO DONALD</creatorcontrib><title>SYSTEM FOR DETECTING STRUCTURAL DEFECTS AND FEATURES BY USING BLACK-BODY RADIATION</title><description>PROBLEM TO BE SOLVED: To provide a system which uses back-body radiation to detect the defects of covering objects. SOLUTION: This is the system which utilizes temperature of a covering object nearly in stable state, in cooperation with an optical inspection system to selectively find defects and characteristics of the object through its covering, without the need for temporary heating, that is, infrared irradiation and reflective imaging. In the system, an optical tester such as infrared camera can be matched with to the wavelength making the covering material approximately transparent, thereby its defects and characteristics can be found clearly at maximum, to distinguish between false characteristics on surface of the covering and true defects and characteristics. Thus this invented system enables inspection of small area or large area in real time, without the need for any complicated image acquisition/storage means, image processing device and software. COPYRIGHT: (C)2006,JPO&NCIPI</description><subject>COLORIMETRY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAgKjgwOcfVVcPMPUnBxDXF1DvH0c1cIDgkKdQ4JDXL0AQq6AQWDFRz9XBTcXB2Bgq7BCk6RCqHBIIVOPo7O3rpO_i6RCkGOLp6OIZ7-fjwMrGmJOcWpvFCam0HJzTXE2UM3tSA_PrW4IDE5NS-1JN4rwMjAwMzQ0NLQ2MTRmChFADkhMAM</recordid><startdate>20060511</startdate><enddate>20060511</enddate><creator>CHU STEVEN</creator><creator>WEIR JOHN DOUGLAS</creator><creator>SILBERSTEIN ROBERT P</creator><creator>DIMARZIO DONALD</creator><scope>EVB</scope></search><sort><creationdate>20060511</creationdate><title>SYSTEM FOR DETECTING STRUCTURAL DEFECTS AND FEATURES BY USING BLACK-BODY RADIATION</title><author>CHU STEVEN ; WEIR JOHN DOUGLAS ; SILBERSTEIN ROBERT P ; DIMARZIO DONALD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2006119134A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>COLORIMETRY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CHU STEVEN</creatorcontrib><creatorcontrib>WEIR JOHN DOUGLAS</creatorcontrib><creatorcontrib>SILBERSTEIN ROBERT P</creatorcontrib><creatorcontrib>DIMARZIO DONALD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHU STEVEN</au><au>WEIR JOHN DOUGLAS</au><au>SILBERSTEIN ROBERT P</au><au>DIMARZIO DONALD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM FOR DETECTING STRUCTURAL DEFECTS AND FEATURES BY USING BLACK-BODY RADIATION</title><date>2006-05-11</date><risdate>2006</risdate><abstract>PROBLEM TO BE SOLVED: To provide a system which uses back-body radiation to detect the defects of covering objects. SOLUTION: This is the system which utilizes temperature of a covering object nearly in stable state, in cooperation with an optical inspection system to selectively find defects and characteristics of the object through its covering, without the need for temporary heating, that is, infrared irradiation and reflective imaging. In the system, an optical tester such as infrared camera can be matched with to the wavelength making the covering material approximately transparent, thereby its defects and characteristics can be found clearly at maximum, to distinguish between false characteristics on surface of the covering and true defects and characteristics. Thus this invented system enables inspection of small area or large area in real time, without the need for any complicated image acquisition/storage means, image processing device and software. COPYRIGHT: (C)2006,JPO&NCIPI</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_JP2006119134A |
| source | esp@cenet |
| subjects | COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | SYSTEM FOR DETECTING STRUCTURAL DEFECTS AND FEATURES BY USING BLACK-BODY RADIATION |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T08%3A02%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CHU%20STEVEN&rft.date=2006-05-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2006119134A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |