SOCKET FOR SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To enable to reduce the occupied area of a socket main body on a printed-circuit board and to arrange the adjoining IC sockets more closely mutually in proximity so as to attain high density of mounting of the IC sockets. SOLUTION: The length of the arm of the pressing members...

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Hauptverfasser:	UJIIE AKIRA, SATO MASARU
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	UJIIE AKIRA SATO MASARU
description	PROBLEM TO BE SOLVED: To enable to reduce the occupied area of a socket main body on a printed-circuit board and to arrange the adjoining IC sockets more closely mutually in proximity so as to attain high density of mounting of the IC sockets. SOLUTION: The length of the arm of the pressing members 26, 28 which are supported rotatably at the lower end of the arm part 30H of a cover member 30 is established corresponding to supporting of semiconductor devices 36, 42 having different outline dimensions, and is established smaller than the length of the arm part 30H such that a part of the pressing members 26, 28 may overhang toward outside through the recessed portion 20b of the socket main body 20. COPYRIGHT: (C)2006,JPO&NCIPI
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SOLUTION: The length of the arm of the pressing members 26, 28 which are supported rotatably at the lower end of the arm part 30H of a cover member 30 is established corresponding to supporting of semiconductor devices 36, 42 having different outline dimensions, and is established smaller than the length of the arm part 30H such that a part of the pressing members 26, 28 may overhang toward outside through the recessed portion 20b of the socket main body 20. COPYRIGHT: (C)2006,JPO&NCIPI</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CURRENT COLLECTORS ; ELECTRICITY ; LINE CONNECTORS ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060223&DB=EPODOC&CC=JP&NR=2006054191A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060223&DB=EPODOC&CC=JP&NR=2006054191A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>UJIIE AKIRA</creatorcontrib><creatorcontrib>SATO MASARU</creatorcontrib><title>SOCKET FOR SEMICONDUCTOR DEVICE</title><description>PROBLEM TO BE SOLVED: To enable to reduce the occupied area of a socket main body on a printed-circuit board and to arrange the adjoining IC sockets more closely mutually in proximity so as to attain high density of mounting of the IC sockets. SOLUTION: The length of the arm of the pressing members 26, 28 which are supported rotatably at the lower end of the arm part 30H of a cover member 30 is established corresponding to supporting of semiconductor devices 36, 42 having different outline dimensions, and is established smaller than the length of the arm part 30H such that a part of the pressing members 26, 28 may overhang toward outside through the recessed portion 20b of the socket main body 20. 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subjects	BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	SOCKET FOR SEMICONDUCTOR DEVICE
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