SOI WAFER AND METHOD FOR PRODUCING IT

PROBLEM TO BE SOLVED: To provide a suitable donor substrate which is manufactured with a high yield, and in which only a slight error-occurrence frequency is guaranteed, when manufacturing a device on an SOI wafer obtained. SOLUTION: The SOI wafer is composed of a carrier wafer and a monocrystalline...

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Hauptverfasser: ZEMKE DIRK, BLIETZ MARKUS, MILLER ALFRED, WAHLICH REINHOLD, GRAEF DIETER
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creator ZEMKE DIRK
BLIETZ MARKUS
MILLER ALFRED
WAHLICH REINHOLD
GRAEF DIETER
description PROBLEM TO BE SOLVED: To provide a suitable donor substrate which is manufactured with a high yield, and in which only a slight error-occurrence frequency is guaranteed, when manufacturing a device on an SOI wafer obtained. SOLUTION: The SOI wafer is composed of a carrier wafer and a monocrystalline silicon layer having a thickness of less than 500 nm, excess of interstitial silicon atoms prevailing in the entire volume of the silicon layer. COPYRIGHT: (C)2006,JPO&NCIPI
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subjects AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE
APPARATUS THEREFOR
BASIC ELECTRIC ELEMENTS
CHEMISTRY
CRYSTAL GROWTH
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
METALLURGY
PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE
REFINING BY ZONE-MELTING OF MATERIAL
SEMICONDUCTOR DEVICES
SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE
SINGLE-CRYSTAL-GROWTH
UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL
title SOI WAFER AND METHOD FOR PRODUCING IT
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