METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To make a mask thin, when a conductive film made of tungsten is etched. SOLUTION: The manufacturing method includes a W film forming step (S108) to form the W film formed of a conductive member containing tungsten (W) on a substrate, a Zr film forming step (S110) for forming a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: SHOJI HIDEYUKI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To make a mask thin, when a conductive film made of tungsten is etched. SOLUTION: The manufacturing method includes a W film forming step (S108) to form the W film formed of a conductive member containing tungsten (W) on a substrate, a Zr film forming step (S110) for forming a Zr film made of zirconium (Zr) on the W film that is formed in the W film formation step (S108), and a W film etching step (S128) for etching the W film, while using the Zr film as a mask that is formed in the Zr film forming step (S110). COPYRIGHT: (C)2005,JPO&NCIPI