EXTRA THIN CONTACT PROBE

PROBLEM TO BE SOLVED: To provide an extra thin contact probe markedly thinner than a conventional one and capable of conducting an inspection of a printed wiring board having a narrow pitch interval without obstacle. SOLUTION: An extra thin linear body having a needle part on the tip is fitted into...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KIYOTA SHIGEO
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TESTING
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