EXTRA THIN CONTACT PROBE

PROBLEM TO BE SOLVED: To provide an extra thin contact probe markedly thinner than a conventional one and capable of conducting an inspection of a printed wiring board having a narrow pitch interval without obstacle. SOLUTION: An extra thin linear body having a needle part on the tip is fitted into...

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Bibliographische Detailangaben
1. Verfasser:	KIYOTA SHIGEO
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRINTED CIRCUITS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an extra thin contact probe markedly thinner than a conventional one and capable of conducting an inspection of a printed wiring board having a narrow pitch interval without obstacle. SOLUTION: An extra thin linear body having a needle part on the tip is fitted into a probe guide as to freely advance and retreat. The back end is abutted on an elastic body and, the extra thin linear body can be elastically moved backward and forward by the elastic force of the elastic body. COPYRIGHT: (C)2005,JPO&NCIPI