ON-BOARD DEBUGGING APPARATUS AND SEMICONDUCTOR CIRCUIT APPARATUS

ON-BOARD DEBUGGING APPARATUS AND SEMICONDUCTOR CIRCUIT APPARATUS

PROBLEM TO BE SOLVED: To solve the problem that the time accuracy in evaluation and analysis of a program is low in the conventional on-board debugging apparatus. SOLUTION: A present on-board debugging apparatus comprises: a serial register 122 receiving execution time information outputted from a s...

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Hauptverfasser: KODAMA MASAYOSHI, OMASA TAKASHI
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator KODAMA MASAYOSHI
OMASA TAKASHI
description PROBLEM TO BE SOLVED: To solve the problem that the time accuracy in evaluation and analysis of a program is low in the conventional on-board debugging apparatus. SOLUTION: A present on-board debugging apparatus comprises: a serial register 122 receiving execution time information outputted from a semiconductor circuit apparatus 101; a timer circuit section 125 outputting a timer count value 127 in accordance with a trigger signal 106 indicative of the output timing of the execution time information; and a FIFO (First-In First-Out) buffer 126 for a time stamp successively storing the timer count values. Through such constitution, it is made possible to correlate a time measurement value measured by means of a time measurement section with the execution time information and store the result without waiting for the reception completion of the execution time information in a data reception section. Consequently, the time stamp value having a reduced time error is acquired. COPYRIGHT: (C)2005,JPO&NCIPI
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SOLUTION: A present on-board debugging apparatus comprises: a serial register 122 receiving execution time information outputted from a semiconductor circuit apparatus 101; a timer circuit section 125 outputting a timer count value 127 in accordance with a trigger signal 106 indicative of the output timing of the execution time information; and a FIFO (First-In First-Out) buffer 126 for a time stamp successively storing the timer count values. Through such constitution, it is made possible to correlate a time measurement value measured by means of a time measurement section with the execution time information and store the result without waiting for the reception completion of the execution time information in a data reception section. Consequently, the time stamp value having a reduced time error is acquired. 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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title ON-BOARD DEBUGGING APPARATUS AND SEMICONDUCTOR CIRCUIT APPARATUS
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