BASE FOR MICROSCOPE

BASE FOR MICROSCOPE

PROBLEM TO BE SOLVED: To provide a base for a microscope capable of accurately and easily aligning a microscope to a specified position and supporting the microscope in a stable state. SOLUTION: The microscope is moved to a specified place by the base 1 for the microscope in a state where a fixed ba...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MATSUURA HIROYUKI, ISOBE YOSHIO
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator MATSUURA HIROYUKI
ISOBE YOSHIO
description PROBLEM TO BE SOLVED: To provide a base for a microscope capable of accurately and easily aligning a microscope to a specified position and supporting the microscope in a stable state. SOLUTION: The microscope is moved to a specified place by the base 1 for the microscope in a state where a fixed base 5 is made to float from a floor surface by attaching a caster 9 to a movable base 6 and moving the base 6 in a downstream direction with respect to the base 5. Thereafter, the base 6 is moved in an upward direction with respect to the base 5 so as to make the base 5 stand on the floor surface, and an air bearing is attached to the base 6 instead of the caster 9, whereby the microscope is accurately and easily aligned to the specified position. Furthermore, since the microscope is supported by the base 5 after the alignment, the microscope can be supported in the stable state. COPYRIGHT: (C)2005,JPO&NCIPI
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2005017654A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2005017654A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2005017654A3</originalsourceid><addsrcrecordid>eNrjZBB2cgx2VXDzD1Lw9XQO8g929g9w5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGpgaG5mamJo7GRCkCAIeuHqA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>BASE FOR MICROSCOPE</title><source>esp@cenet</source><creator>MATSUURA HIROYUKI ; ISOBE YOSHIO</creator><creatorcontrib>MATSUURA HIROYUKI ; ISOBE YOSHIO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a base for a microscope capable of accurately and easily aligning a microscope to a specified position and supporting the microscope in a stable state. SOLUTION: The microscope is moved to a specified place by the base 1 for the microscope in a state where a fixed base 5 is made to float from a floor surface by attaching a caster 9 to a movable base 6 and moving the base 6 in a downstream direction with respect to the base 5. Thereafter, the base 6 is moved in an upward direction with respect to the base 5 so as to make the base 5 stand on the floor surface, and an air bearing is attached to the base 6 instead of the caster 9, whereby the microscope is accurately and easily aligned to the specified position. Furthermore, since the microscope is supported by the base 5 after the alignment, the microscope can be supported in the stable state. COPYRIGHT: (C)2005,JPO&amp;NCIPI</description><edition>7</edition><language>eng</language><subject>MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20050120&amp;DB=EPODOC&amp;CC=JP&amp;NR=2005017654A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20050120&amp;DB=EPODOC&amp;CC=JP&amp;NR=2005017654A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MATSUURA HIROYUKI</creatorcontrib><creatorcontrib>ISOBE YOSHIO</creatorcontrib><title>BASE FOR MICROSCOPE</title><description>PROBLEM TO BE SOLVED: To provide a base for a microscope capable of accurately and easily aligning a microscope to a specified position and supporting the microscope in a stable state. SOLUTION: The microscope is moved to a specified place by the base 1 for the microscope in a state where a fixed base 5 is made to float from a floor surface by attaching a caster 9 to a movable base 6 and moving the base 6 in a downstream direction with respect to the base 5. Thereafter, the base 6 is moved in an upward direction with respect to the base 5 so as to make the base 5 stand on the floor surface, and an air bearing is attached to the base 6 instead of the caster 9, whereby the microscope is accurately and easily aligned to the specified position. Furthermore, since the microscope is supported by the base 5 after the alignment, the microscope can be supported in the stable state. COPYRIGHT: (C)2005,JPO&amp;NCIPI</description><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBB2cgx2VXDzD1Lw9XQO8g929g9w5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGpgaG5mamJo7GRCkCAIeuHqA</recordid><startdate>20050120</startdate><enddate>20050120</enddate><creator>MATSUURA HIROYUKI</creator><creator>ISOBE YOSHIO</creator><scope>EVB</scope></search><sort><creationdate>20050120</creationdate><title>BASE FOR MICROSCOPE</title><author>MATSUURA HIROYUKI ; ISOBE YOSHIO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2005017654A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>MATSUURA HIROYUKI</creatorcontrib><creatorcontrib>ISOBE YOSHIO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MATSUURA HIROYUKI</au><au>ISOBE YOSHIO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>BASE FOR MICROSCOPE</title><date>2005-01-20</date><risdate>2005</risdate><abstract>PROBLEM TO BE SOLVED: To provide a base for a microscope capable of accurately and easily aligning a microscope to a specified position and supporting the microscope in a stable state. SOLUTION: The microscope is moved to a specified place by the base 1 for the microscope in a state where a fixed base 5 is made to float from a floor surface by attaching a caster 9 to a movable base 6 and moving the base 6 in a downstream direction with respect to the base 5. Thereafter, the base 6 is moved in an upward direction with respect to the base 5 so as to make the base 5 stand on the floor surface, and an air bearing is attached to the base 6 instead of the caster 9, whereby the microscope is accurately and easily aligned to the specified position. Furthermore, since the microscope is supported by the base 5 after the alignment, the microscope can be supported in the stable state. COPYRIGHT: (C)2005,JPO&amp;NCIPI</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2005017654A
source esp@cenet
subjects MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title BASE FOR MICROSCOPE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T07%3A37%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MATSUURA%20HIROYUKI&rft.date=2005-01-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2005017654A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true