TEMPERATURE CHARACTERISTIC MEASURING DEVICE FOR WAVELENGTH SELECTION OPTICAL FILTER, AND MEASURING METHOD USING THE SAME
PROBLEM TO BE SOLVED: To provide a temperature characteristic measuring device which enables its miniaturization, and elimination of a measuring error resulting from the in-plane distribution of a wavelength selection property. SOLUTION: To a fixing means 42 one end side of a tabular thermally condu...
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| creator | NISHIMOTO MASUO |
| description | PROBLEM TO BE SOLVED: To provide a temperature characteristic measuring device which enables its miniaturization, and elimination of a measuring error resulting from the in-plane distribution of a wavelength selection property. SOLUTION: To a fixing means 42 one end side of a tabular thermally conductive member 41 is fixed, and to the one end side a heat-exchanging means 51 is attached. A turntable 43 made of metal is installed rotatably on the other end side of the conductive member 41, and on that turntable 43 a wavelength selection optical filter 31 is put. The conductive member 41 can be miniaturized, since it does not have structure of being fixed perfectly with two or more fixing members as before. A measuring error resulting from in-plane distribution produced by a displacement of the optical filter 31 caused by a thermal expansion of the conductive member 41, can be offset by averaging temperature dependency data before and after a 180° rotation of the turntable 43. COPYRIGHT: (C)2004,JPO&NCIPI |
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| subjects | MEASURING PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | TEMPERATURE CHARACTERISTIC MEASURING DEVICE FOR WAVELENGTH SELECTION OPTICAL FILTER, AND MEASURING METHOD USING THE SAME |
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