MULTILAYER CIRCUIT BOARD, METHOD OF PROCESSING BLIND HOLE THEREIN AND PROBE FOR MEASUREMENT

PROBLEM TO BE SOLVED: To provide a method of processing a blind hole in a multilayer circuit board which allows easy confirmation of the location of an inner layer and can increase the processing accuracy, and also to provide the multilayer circuit board and a probe for inspection. SOLUTION: Conduct...

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Bibliographische Detailangaben
Hauptverfasser: ITO YASUSHI, YUKI TORU, OTANI TAMIO
Format: Patent
Sprache:eng
Schlagworte:
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