DISTRIBUTED PROCESSING METHOD OF OPERATION IN MEASURING DEVICE

PROBLEM TO BE SOLVED: To provide an operation processing method of a waveform measuring device capable of performing operation processing at high speed by performing distributed processing by a general purpose computer relative to processing such as a complicated operation in the waveform measuring...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KUWABARA YOHEI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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