TEST SYSTEM

PROBLEM TO BE SOLVED: To provide a test system monitoring a lamp showing the anomaly or outage of an IC tester and providing continuous monitoring for problems needing immediate countermeasures when there is an anomaly or outage without looking at the lamp directly. SOLUTION: The IC tester 1 is for...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	YANAGAWA TSUTOMU, MOTOOKA RYUTA, TATENO KAZUHIKO, KAWAKATSU ATSUSHI, TAGAWA MASAMITSU
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a test system monitoring a lamp showing the anomaly or outage of an IC tester and providing continuous monitoring for problems needing immediate countermeasures when there is an anomaly or outage without looking at the lamp directly. SOLUTION: The IC tester 1 is for testing an object to be tested. The state of the IC tester 1 is sent to a server via a network L, the state is sent to a portable terminal carried by a maintenance person by radio, and the operation of a conveyance device in the IC tester 1 is controlled from the portable terminal. COPYRIGHT: (C)2004,JPO