METHOD AND APPARATUS FOR MEASUREMENT OF FILM THICKNESS AS WELL AS METHOD AND APPARATUS FOR FORMATION OF MAGNETIC RECORDING MEDIUM

PROBLEM TO BE SOLVED: To provide a film-thickness measuring apparatus by which the film thickness of two layers on the whole face and in the whole length of a magnetic recording medium can be measured and by which the film thickness during a coating process can be measured in real time. SOLUTION: Th...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	IWABUCHI KENJI, KIKUCHI KIYOYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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