ION SOURCE AND MASS SPECTROMETER USING THE SAME

PROBLEM TO BE SOLVED: To provide an apparatus for efficiently detecting trace components in a sample, in both positive and negative ion measurement modes. SOLUTION: Both types of ions can be sensitively detected by switching the flow direction of sample gas to an ionization area inside the ion sourc...

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Bibliographische Detailangaben

Hauptverfasser:	YAMADA MASUYOSHI, TAKADA YASUAKI, KAN MASAO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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