METHOD AND APPARATUS FOR MEASURING ROUGHNESS

PROBLEM TO BE SOLVED: To provide a method and an apparatus for measuring a roughness; whereby the surface roughness of a work without a cut-off value indicated can be correctly measured. SOLUTION: An auxiliary storage 34, in which a plurality of cut-off values specified by standards (0.08, 0.25, 0.8...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	ENOMOTO MASAHITO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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