FLOW TYPE METHOD AND APPARATUS FOR ANALYZING PARTICLE IMAGE
PROBLEM TO BE SOLVED: To realize a flow type method for analyzing particle images whereby the particle concentration can be correctly calculated even when a sample includes particles that should be detected/processed in two measurement modes because the particle size of particle components spreads i...
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creator | HORIUCHI HIDEYUKI |
description | PROBLEM TO BE SOLVED: To realize a flow type method for analyzing particle images whereby the particle concentration can be correctly calculated even when a sample includes particles that should be detected/processed in two measurement modes because the particle size of particle components spreads in a wide range. SOLUTION: A first measurement mode is set to analyze/process mainly particle components A of a small particle size and a large number, while a second measurement mode is set to analyze/process particle components B of a small number and a large size. In consequence, it is difficult to measure a correct particle concentration for particle components C distributing wide in terms of the particle size. The first measurement mode is separated by a detecting level CsTH2 to regions 1 and 2, and the second measurement mode is separated by the detecting level CsTH2 to regions 3 and 4. Particle components are processed as one continuous data from those of the small particle size to those of the large particle size with the use of particle information detected in the regions 1-4, thereby, the correct particle concentration can be measured for the particle components C as well. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2002071548A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2002071548A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2002071548A3</originalsourceid><addsrcrecordid>eNrjZLB28_EPVwiJDHBV8HUN8fB3UXD0A-KAAMcgx5DQYAU3_yCgiKNPZJSnn7sCUDTE09nHVcHT19HdlYeBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxHsFGBkYGBmYG5qaWDgaE6UIACGYKZo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>FLOW TYPE METHOD AND APPARATUS FOR ANALYZING PARTICLE IMAGE</title><source>esp@cenet</source><creator>HORIUCHI HIDEYUKI</creator><creatorcontrib>HORIUCHI HIDEYUKI</creatorcontrib><description>PROBLEM TO BE SOLVED: To realize a flow type method for analyzing particle images whereby the particle concentration can be correctly calculated even when a sample includes particles that should be detected/processed in two measurement modes because the particle size of particle components spreads in a wide range. SOLUTION: A first measurement mode is set to analyze/process mainly particle components A of a small particle size and a large number, while a second measurement mode is set to analyze/process particle components B of a small number and a large size. In consequence, it is difficult to measure a correct particle concentration for particle components C distributing wide in terms of the particle size. The first measurement mode is separated by a detecting level CsTH2 to regions 1 and 2, and the second measurement mode is separated by the detecting level CsTH2 to regions 3 and 4. Particle components are processed as one continuous data from those of the small particle size to those of the large particle size with the use of particle information detected in the regions 1-4, thereby, the correct particle concentration can be measured for the particle components C as well.</description><edition>7</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2002</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020308&DB=EPODOC&CC=JP&NR=2002071548A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20020308&DB=EPODOC&CC=JP&NR=2002071548A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HORIUCHI HIDEYUKI</creatorcontrib><title>FLOW TYPE METHOD AND APPARATUS FOR ANALYZING PARTICLE IMAGE</title><description>PROBLEM TO BE SOLVED: To realize a flow type method for analyzing particle images whereby the particle concentration can be correctly calculated even when a sample includes particles that should be detected/processed in two measurement modes because the particle size of particle components spreads in a wide range. SOLUTION: A first measurement mode is set to analyze/process mainly particle components A of a small particle size and a large number, while a second measurement mode is set to analyze/process particle components B of a small number and a large size. In consequence, it is difficult to measure a correct particle concentration for particle components C distributing wide in terms of the particle size. The first measurement mode is separated by a detecting level CsTH2 to regions 1 and 2, and the second measurement mode is separated by the detecting level CsTH2 to regions 3 and 4. Particle components are processed as one continuous data from those of the small particle size to those of the large particle size with the use of particle information detected in the regions 1-4, thereby, the correct particle concentration can be measured for the particle components C as well.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2002</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB28_EPVwiJDHBV8HUN8fB3UXD0A-KAAMcgx5DQYAU3_yCgiKNPZJSnn7sCUDTE09nHVcHT19HdlYeBNS0xpziVF0pzMyi5uYY4e-imFuTHpxYXJCan5qWWxHsFGBkYGBmYG5qaWDgaE6UIACGYKZo</recordid><startdate>20020308</startdate><enddate>20020308</enddate><creator>HORIUCHI HIDEYUKI</creator><scope>EVB</scope></search><sort><creationdate>20020308</creationdate><title>FLOW TYPE METHOD AND APPARATUS FOR ANALYZING PARTICLE IMAGE</title><author>HORIUCHI HIDEYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2002071548A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2002</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HORIUCHI HIDEYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HORIUCHI HIDEYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>FLOW TYPE METHOD AND APPARATUS FOR ANALYZING PARTICLE IMAGE</title><date>2002-03-08</date><risdate>2002</risdate><abstract>PROBLEM TO BE SOLVED: To realize a flow type method for analyzing particle images whereby the particle concentration can be correctly calculated even when a sample includes particles that should be detected/processed in two measurement modes because the particle size of particle components spreads in a wide range. SOLUTION: A first measurement mode is set to analyze/process mainly particle components A of a small particle size and a large number, while a second measurement mode is set to analyze/process particle components B of a small number and a large size. In consequence, it is difficult to measure a correct particle concentration for particle components C distributing wide in terms of the particle size. The first measurement mode is separated by a detecting level CsTH2 to regions 1 and 2, and the second measurement mode is separated by the detecting level CsTH2 to regions 3 and 4. Particle components are processed as one continuous data from those of the small particle size to those of the large particle size with the use of particle information detected in the regions 1-4, thereby, the correct particle concentration can be measured for the particle components C as well.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | FLOW TYPE METHOD AND APPARATUS FOR ANALYZING PARTICLE IMAGE |
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