CIRCUIT FOR EVALUATING ELECTROMIGRATION

PROBLEM TO BE SOLVED: To provide a circuit for evaluating electromigration resistance of an element being evaluated with high accuracy. SOLUTION: Under a state where transfer gates 40, 41 are turned on and the end of an element 1 being evaluated is connected electrically with external measuring term...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	OTSUJI YUICHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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