APPARATUS AND METHOD FOR ALIGNING SUBSTRATE
PROBLEM TO BE SOLVED: To provide a simple apparatus for aligning a substrate at a low cost capable of rapidly conducting an alignment of the substrate in X-Y direction and θ direction by using a necessary minimum limit number of sensors. SOLUTION: The apparatus for aligning the substrate comprises a...
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creator | HASEGAWA TSUNEO |
description | PROBLEM TO BE SOLVED: To provide a simple apparatus for aligning a substrate at a low cost capable of rapidly conducting an alignment of the substrate in X-Y direction and θ direction by using a necessary minimum limit number of sensors. SOLUTION: The apparatus for aligning the substrate comprises a substrate stage WST for placing the substrate W, a rotating mechanism STa for rotating the stage WST at a predetermined axis AX as a center, a moving mechanism STb for moving the stage WST in a plane X-Y substantially perpendicular to the axis AX, first sensors 1a and 1b provided near a peripheral edge of the substrate W to sense a position of the substrate W in a rotating direction θ, and second sensors 2 provided near the peripheral edge of the substrate at a substantially symmetrical positions to the sensors 1a and 1b, thereby sensing the position of the first direction X substantially parallel to a surface of the substrate W by the sensors 1a and 1b and the sensors 2. |
format | Patent |
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SOLUTION: The apparatus for aligning the substrate comprises a substrate stage WST for placing the substrate W, a rotating mechanism STa for rotating the stage WST at a predetermined axis AX as a center, a moving mechanism STb for moving the stage WST in a plane X-Y substantially perpendicular to the axis AX, first sensors 1a and 1b provided near a peripheral edge of the substrate W to sense a position of the substrate W in a rotating direction θ, and second sensors 2 provided near the peripheral edge of the substrate at a substantially symmetrical positions to the sensors 1a and 1b, thereby sensing the position of the first direction X substantially parallel to a surface of the substrate W by the sensors 1a and 1b and the sensors 2.</description><edition>7</edition><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2001</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20011226&DB=EPODOC&CC=JP&NR=2001358203A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20011226&DB=EPODOC&CC=JP&NR=2001358203A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HASEGAWA TSUNEO</creatorcontrib><title>APPARATUS AND METHOD FOR ALIGNING SUBSTRATE</title><description>PROBLEM TO BE SOLVED: To provide a simple apparatus for aligning a substrate at a low cost capable of rapidly conducting an alignment of the substrate in X-Y direction and θ direction by using a necessary minimum limit number of sensors. SOLUTION: The apparatus for aligning the substrate comprises a substrate stage WST for placing the substrate W, a rotating mechanism STa for rotating the stage WST at a predetermined axis AX as a center, a moving mechanism STb for moving the stage WST in a plane X-Y substantially perpendicular to the axis AX, first sensors 1a and 1b provided near a peripheral edge of the substrate W to sense a position of the substrate W in a rotating direction θ, and second sensors 2 provided near the peripheral edge of the substrate at a substantially symmetrical positions to the sensors 1a and 1b, thereby sensing the position of the first direction X substantially parallel to a surface of the substrate W by the sensors 1a and 1b and the sensors 2.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2001</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB2DAhwDHIMCQ1WcPRzUfB1DfHwd1Fw8w9ScPTxdPfz9HNXCA51Cg4BKnHlYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBgaGxqYWRgbGjsZEKQIAuFElSA</recordid><startdate>20011226</startdate><enddate>20011226</enddate><creator>HASEGAWA TSUNEO</creator><scope>EVB</scope></search><sort><creationdate>20011226</creationdate><title>APPARATUS AND METHOD FOR ALIGNING SUBSTRATE</title><author>HASEGAWA TSUNEO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2001358203A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2001</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>HASEGAWA TSUNEO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HASEGAWA TSUNEO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS AND METHOD FOR ALIGNING SUBSTRATE</title><date>2001-12-26</date><risdate>2001</risdate><abstract>PROBLEM TO BE SOLVED: To provide a simple apparatus for aligning a substrate at a low cost capable of rapidly conducting an alignment of the substrate in X-Y direction and θ direction by using a necessary minimum limit number of sensors. SOLUTION: The apparatus for aligning the substrate comprises a substrate stage WST for placing the substrate W, a rotating mechanism STa for rotating the stage WST at a predetermined axis AX as a center, a moving mechanism STb for moving the stage WST in a plane X-Y substantially perpendicular to the axis AX, first sensors 1a and 1b provided near a peripheral edge of the substrate W to sense a position of the substrate W in a rotating direction θ, and second sensors 2 provided near the peripheral edge of the substrate at a substantially symmetrical positions to the sensors 1a and 1b, thereby sensing the position of the first direction X substantially parallel to a surface of the substrate W by the sensors 1a and 1b and the sensors 2.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES |
title | APPARATUS AND METHOD FOR ALIGNING SUBSTRATE |
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