MEASURING INSTRUMENT

PROBLEM TO BE SOLVED: To eliminate the need of performing various setting when an attached function displaying means is changed. SOLUTION: A measuring instrument 1 is provided with a main body 2 having at least an operating section 13 in which control switches 21a-21x are arranged and function displ...

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1. Verfasser:	MIZUIDE HIROSHI
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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creator	MIZUIDE HIROSHI
description	PROBLEM TO BE SOLVED: To eliminate the need of performing various setting when an attached function displaying means is changed. SOLUTION: A measuring instrument 1 is provided with a main body 2 having at least an operating section 13 in which control switches 21a-21x are arranged and function displaying means 3a and 3b which are constituted in such a way that the means 3a and 3b can be detachably attached to the operating section 13 and display characters or symbols respectively indicating the functions assigned to the switches 21a-21x. The displaying means 3a and 3b are respectively provided with classification information transmitting means 37a and 37b which can transmit the classification information of the displaying means 3a and 3b to the main body 2 when the means 3a and 3b are attached to the operating section 13. The main body 2 is provided with class information inputting means SW1-SW4 which can input the class information transmitted from the transmitting means 37a and 37b and executes prescribed processing in response to the class information inputted through the inputting means SW1-SW4.
format	Patent
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SOLUTION: A measuring instrument 1 is provided with a main body 2 having at least an operating section 13 in which control switches 21a-21x are arranged and function displaying means 3a and 3b which are constituted in such a way that the means 3a and 3b can be detachably attached to the operating section 13 and display characters or symbols respectively indicating the functions assigned to the switches 21a-21x. The displaying means 3a and 3b are respectively provided with classification information transmitting means 37a and 37b which can transmit the classification information of the displaying means 3a and 3b to the main body 2 when the means 3a and 3b are attached to the operating section 13. 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The main body 2 is provided with class information inputting means SW1-SW4 which can input the class information transmitted from the transmitting means 37a and 37b and executes prescribed processing in response to the class information inputted through the inputting means SW1-SW4.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2001</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBDxdXUMDg3y9HNX8PQLDgkK9XX1C-FhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGBoaGFsbGlqaOxkQpAgDQOh9T</recordid><startdate>20010706</startdate><enddate>20010706</enddate><creator>MIZUIDE HIROSHI</creator><scope>EVB</scope></search><sort><creationdate>20010706</creationdate><title>MEASURING INSTRUMENT</title><author>MIZUIDE HIROSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2001183395A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2001</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MIZUIDE HIROSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MIZUIDE HIROSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MEASURING INSTRUMENT</title><date>2001-07-06</date><risdate>2001</risdate><abstract>PROBLEM TO BE SOLVED: To eliminate the need of performing various setting when an attached function displaying means is changed. SOLUTION: A measuring instrument 1 is provided with a main body 2 having at least an operating section 13 in which control switches 21a-21x are arranged and function displaying means 3a and 3b which are constituted in such a way that the means 3a and 3b can be detachably attached to the operating section 13 and display characters or symbols respectively indicating the functions assigned to the switches 21a-21x. The displaying means 3a and 3b are respectively provided with classification information transmitting means 37a and 37b which can transmit the classification information of the displaying means 3a and 3b to the main body 2 when the means 3a and 3b are attached to the operating section 13. 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subjects	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
title	MEASURING INSTRUMENT
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