INTERFACE

INTERFACE

PROBLEM TO BE SOLVED: To provide a more inexpensive interface between a testing device and an application device. SOLUTION: An interface tower 300 includes a frame 305 provided with a plurality of recessed parts 310i (i=A, B, C, etc.), each accommodating each segments 320i (i=A, B, C, etc.). The seg...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: ZAISER JOCHEN
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
SIGNALLING
TESTING
TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILARSIGNALS
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a more inexpensive interface between a testing device and an application device. SOLUTION: An interface tower 300 includes a frame 305 provided with a plurality of recessed parts 310i (i=A, B, C, etc.), each accommodating each segments 320i (i=A, B, C, etc.). The segments 320A and 320D are shown separated from the interface tower 300. Some of the segments are embodied as a blank or a dummy segment without an electrical contacting part, and some can be embodied as segments provided a plurality of electrical contacting parts for applying electrical contact between each contacting part of a DUT substrate 30 and a probe card 20.