DURABILITY TEST APPARATUS

DURABILITY TEST APPARATUS

PROBLEM TO BE SOLVED: To execute an accurate durability test by always supplying a specified conduction current to an electronic controller. SOLUTION: The durability tester has a current sensor 1 which monitors currents being supplied to loads R1-Rn connected to an electronic controller Ob, thereby...

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1. Verfasser: YAMAMURA TAKEHIKO
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator YAMAMURA TAKEHIKO
description PROBLEM TO BE SOLVED: To execute an accurate durability test by always supplying a specified conduction current to an electronic controller. SOLUTION: The durability tester has a current sensor 1 which monitors currents being supplied to loads R1-Rn connected to an electronic controller Ob, thereby detecting failures of the loads R1-Rn during test. In repeatedly driving each load R1-Rn, when a failure is found, the driving of associated failed load is stopped and the next load is repeatedly driven, thereby always supplying a specified conduction current to the electronic controller Ob.
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In repeatedly driving each load R1-Rn, when a failure is found, the driving of associated failed load is stopped and the next load is repeatedly driven, thereby always supplying a specified conduction current to the electronic controller Ob.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2001</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB0CQ1ydPL08QyJVAhxDQ5RcAwIcAxyDAkN5mFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGhgamhgYGRo7GRCkCAGFRIHQ</recordid><startdate>20010223</startdate><enddate>20010223</enddate><creator>YAMAMURA TAKEHIKO</creator><scope>EVB</scope></search><sort><creationdate>20010223</creationdate><title>DURABILITY TEST APPARATUS</title><author>YAMAMURA TAKEHIKO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2001051002A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2001</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YAMAMURA TAKEHIKO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAMAMURA TAKEHIKO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DURABILITY TEST APPARATUS</title><date>2001-02-23</date><risdate>2001</risdate><abstract>PROBLEM TO BE SOLVED: To execute an accurate durability test by always supplying a specified conduction current to an electronic controller. 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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title DURABILITY TEST APPARATUS
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