METHOD AND APPARATUS FOR REDUCING ESD-INDUCED EMI RADIATING FROM I/O CONNECTOR APERTURE
PROBLEM TO BE SOLVED: To provide a method and an apparatus to solve the problem of I/O card fault caused by the ESD-induced EMI in an area near the opening of chassis. SOLUTION: Conductive boots 10L, 10R are provided covering an I/O cable 3. The boots 10L, 10R are physically mounted to the chassis 4...
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