IMAGE DISPLAY METHOD OF SCANNING ELECTRON MICROSCOPE

PROBLEM TO BE SOLVED: To realize an image display method of a scanning electron microscope capable of quantitatively observing the state of unevenness of the surface of a sample. SOLUTION: X-Y two-dimensional coordinates of a signal detected in conjunction with two-dimensional scanning of a predeter...

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Bibliographische Detailangaben
1. Verfasser: YAMADA MITSUGI
Format: Patent
Sprache:eng
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