IMAGE DISPLAY METHOD OF SCANNING ELECTRON MICROSCOPE

PROBLEM TO BE SOLVED: To realize an image display method of a scanning electron microscope capable of quantitatively observing the state of unevenness of the surface of a sample. SOLUTION: X-Y two-dimensional coordinates of a signal detected in conjunction with two-dimensional scanning of a predeter...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: YAMADA MITSUGI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator YAMADA MITSUGI
description PROBLEM TO BE SOLVED: To realize an image display method of a scanning electron microscope capable of quantitatively observing the state of unevenness of the surface of a sample. SOLUTION: X-Y two-dimensional coordinates of a signal detected in conjunction with two-dimensional scanning of a predetermined region on a sample 4 are transformed into rhombus coordinates by an affine transformer 22. As a result, a rhombus-shaped image is displayed on a cathode-ray tube 15. An electron beam is linearly and repeatedly scanned at two end positions in the predetermined region on the sample 4, the focus of the electron beam is changed in a predetermined range during the process of the repetitive scanning, and a signal obtained from the sample for every focus is displayed, by displacing it at an end position corresponding to the scanning of the electron beam of the rhombus-shaped image.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2000208086A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2000208086A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2000208086A3</originalsourceid><addsrcrecordid>eNrjZDDx9HV0d1Vw8QwO8HGMVPB1DfHwd1Hwd1MIdnb08_P0c1dw9XF1Dgny91Pw9XQO8g929g9w5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGBkYGFgYWZo7GRCkCAAU9J7M</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IMAGE DISPLAY METHOD OF SCANNING ELECTRON MICROSCOPE</title><source>esp@cenet</source><creator>YAMADA MITSUGI</creator><creatorcontrib>YAMADA MITSUGI</creatorcontrib><description>PROBLEM TO BE SOLVED: To realize an image display method of a scanning electron microscope capable of quantitatively observing the state of unevenness of the surface of a sample. SOLUTION: X-Y two-dimensional coordinates of a signal detected in conjunction with two-dimensional scanning of a predetermined region on a sample 4 are transformed into rhombus coordinates by an affine transformer 22. As a result, a rhombus-shaped image is displayed on a cathode-ray tube 15. An electron beam is linearly and repeatedly scanned at two end positions in the predetermined region on the sample 4, the focus of the electron beam is changed in a predetermined range during the process of the repetitive scanning, and a signal obtained from the sample for every focus is displayed, by displacing it at an end position corresponding to the scanning of the electron beam of the rhombus-shaped image.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000728&amp;DB=EPODOC&amp;CC=JP&amp;NR=2000208086A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000728&amp;DB=EPODOC&amp;CC=JP&amp;NR=2000208086A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAMADA MITSUGI</creatorcontrib><title>IMAGE DISPLAY METHOD OF SCANNING ELECTRON MICROSCOPE</title><description>PROBLEM TO BE SOLVED: To realize an image display method of a scanning electron microscope capable of quantitatively observing the state of unevenness of the surface of a sample. SOLUTION: X-Y two-dimensional coordinates of a signal detected in conjunction with two-dimensional scanning of a predetermined region on a sample 4 are transformed into rhombus coordinates by an affine transformer 22. As a result, a rhombus-shaped image is displayed on a cathode-ray tube 15. An electron beam is linearly and repeatedly scanned at two end positions in the predetermined region on the sample 4, the focus of the electron beam is changed in a predetermined range during the process of the repetitive scanning, and a signal obtained from the sample for every focus is displayed, by displacing it at an end position corresponding to the scanning of the electron beam of the rhombus-shaped image.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDx9HV0d1Vw8QwO8HGMVPB1DfHwd1Hwd1MIdnb08_P0c1dw9XF1Dgny91Pw9XQO8g929g9w5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGBkYGFgYWZo7GRCkCAAU9J7M</recordid><startdate>20000728</startdate><enddate>20000728</enddate><creator>YAMADA MITSUGI</creator><scope>EVB</scope></search><sort><creationdate>20000728</creationdate><title>IMAGE DISPLAY METHOD OF SCANNING ELECTRON MICROSCOPE</title><author>YAMADA MITSUGI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2000208086A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2000</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>YAMADA MITSUGI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAMADA MITSUGI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMAGE DISPLAY METHOD OF SCANNING ELECTRON MICROSCOPE</title><date>2000-07-28</date><risdate>2000</risdate><abstract>PROBLEM TO BE SOLVED: To realize an image display method of a scanning electron microscope capable of quantitatively observing the state of unevenness of the surface of a sample. SOLUTION: X-Y two-dimensional coordinates of a signal detected in conjunction with two-dimensional scanning of a predetermined region on a sample 4 are transformed into rhombus coordinates by an affine transformer 22. As a result, a rhombus-shaped image is displayed on a cathode-ray tube 15. An electron beam is linearly and repeatedly scanned at two end positions in the predetermined region on the sample 4, the focus of the electron beam is changed in a predetermined range during the process of the repetitive scanning, and a signal obtained from the sample for every focus is displayed, by displacing it at an end position corresponding to the scanning of the electron beam of the rhombus-shaped image.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2000208086A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
title IMAGE DISPLAY METHOD OF SCANNING ELECTRON MICROSCOPE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T09%3A46%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YAMADA%20MITSUGI&rft.date=2000-07-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2000208086A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true