DEVICE AND METHOD FOR INSPECTING LIQUID CRYSTAL DRIVE SUBSTRATE
PROBLEM TO BE SOLVED: To secure sufficient writing time without reducing throughput by picking up the surface image of an electro-optic element plate, adding and generating images over a plurality of frames during each polarity period of a bias voltage, and identifying the failed part of a pixel ele...
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| creator | ISHIHARA TERUMASA KURIYAMA SHIGEYUKI |
| description | PROBLEM TO BE SOLVED: To secure sufficient writing time without reducing throughput by picking up the surface image of an electro-optic element plate, adding and generating images over a plurality of frames during each polarity period of a bias voltage, and identifying the failed part of a pixel electrode. SOLUTION: An image-processing device generates an image to be inspected to be subjected to image processing by adding continuous four-frame voltage images up to frames A-D related to the surface of a modulator. In this case, a bias voltage EB is set to a negative polarity, for example, during the image pick-up period of A and C frames and a data voltage ED of each frame is set to a completely different value. The voltage ED is set to values that differ from a specific voltage Ea in the frame A. The voltage ED is set to a value where a voltage Δea is added to the voltage Ea in the frame A, a value where a voltage Δeb is added to the voltage Ea in the frame B, a value where a voltage Δec is subtracted from the voltage Ea in the frame C, and a value where a voltage Δed is subtracted from the voltage Ea in the frame D. |
| format | Patent |
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SOLUTION: An image-processing device generates an image to be inspected to be subjected to image processing by adding continuous four-frame voltage images up to frames A-D related to the surface of a modulator. In this case, a bias voltage EB is set to a negative polarity, for example, during the image pick-up period of A and C frames and a data voltage ED of each frame is set to a completely different value. The voltage ED is set to values that differ from a specific voltage Ea in the frame A. The voltage ED is set to a value where a voltage Δea is added to the voltage Ea in the frame A, a value where a voltage Δeb is added to the voltage Ea in the frame B, a value where a voltage Δec is subtracted from the voltage Ea in the frame C, and a value where a voltage Δed is subtracted from the voltage Ea in the frame D.</description><edition>7</edition><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20000526&DB=EPODOC&CC=JP&NR=2000146754A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20000526&DB=EPODOC&CC=JP&NR=2000146754A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ISHIHARA TERUMASA</creatorcontrib><creatorcontrib>KURIYAMA SHIGEYUKI</creatorcontrib><title>DEVICE AND METHOD FOR INSPECTING LIQUID CRYSTAL DRIVE SUBSTRATE</title><description>PROBLEM TO BE SOLVED: To secure sufficient writing time without reducing throughput by picking up the surface image of an electro-optic element plate, adding and generating images over a plurality of frames during each polarity period of a bias voltage, and identifying the failed part of a pixel electrode. SOLUTION: An image-processing device generates an image to be inspected to be subjected to image processing by adding continuous four-frame voltage images up to frames A-D related to the surface of a modulator. In this case, a bias voltage EB is set to a negative polarity, for example, during the image pick-up period of A and C frames and a data voltage ED of each frame is set to a completely different value. The voltage ED is set to values that differ from a specific voltage Ea in the frame A. The voltage ED is set to a value where a voltage Δea is added to the voltage Ea in the frame A, a value where a voltage Δeb is added to the voltage Ea in the frame B, a value where a voltage Δec is subtracted from the voltage Ea in the frame C, and a value where a voltage Δed is subtracted from the voltage Ea in the frame D.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLB3cQ3zdHZVcPRzUfB1DfHwd1Fw8w9S8PQLDnB1DvH0c1fw8QwM9XRRcA6KDA5x9FFwCfIMc1UIDnUKDglyDHHlYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBgYGhiZm5qYmjsZEKQIAzdsq1A</recordid><startdate>20000526</startdate><enddate>20000526</enddate><creator>ISHIHARA TERUMASA</creator><creator>KURIYAMA SHIGEYUKI</creator><scope>EVB</scope></search><sort><creationdate>20000526</creationdate><title>DEVICE AND METHOD FOR INSPECTING LIQUID CRYSTAL DRIVE SUBSTRATE</title><author>ISHIHARA TERUMASA ; KURIYAMA SHIGEYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2000146754A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2000</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>ISHIHARA TERUMASA</creatorcontrib><creatorcontrib>KURIYAMA SHIGEYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ISHIHARA TERUMASA</au><au>KURIYAMA SHIGEYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE AND METHOD FOR INSPECTING LIQUID CRYSTAL DRIVE SUBSTRATE</title><date>2000-05-26</date><risdate>2000</risdate><abstract>PROBLEM TO BE SOLVED: To secure sufficient writing time without reducing throughput by picking up the surface image of an electro-optic element plate, adding and generating images over a plurality of frames during each polarity period of a bias voltage, and identifying the failed part of a pixel electrode. SOLUTION: An image-processing device generates an image to be inspected to be subjected to image processing by adding continuous four-frame voltage images up to frames A-D related to the surface of a modulator. In this case, a bias voltage EB is set to a negative polarity, for example, during the image pick-up period of A and C frames and a data voltage ED of each frame is set to a completely different value. The voltage ED is set to values that differ from a specific voltage Ea in the frame A. The voltage ED is set to a value where a voltage Δea is added to the voltage Ea in the frame A, a value where a voltage Δeb is added to the voltage Ea in the frame B, a value where a voltage Δec is subtracted from the voltage Ea in the frame C, and a value where a voltage Δed is subtracted from the voltage Ea in the frame D.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | DEVICE AND METHOD FOR INSPECTING LIQUID CRYSTAL DRIVE SUBSTRATE |
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