OBLIQUE INCIDENT INTERFEROMETER

PROBLEM TO BE SOLVED: To obtain an interference fringe image having good contrast by shortening an optical path difference of a reference light and an object beam shorter than a coherence length of the reference light by a light quantity attenuation path matching member, and reducing a light quantit...

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Hauptverfasser: HIZUKA MASATOSHI, KOBAYASHI FUMIO, SAITO TAKAYUKI
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creator HIZUKA MASATOSHI
KOBAYASHI FUMIO
SAITO TAKAYUKI
description PROBLEM TO BE SOLVED: To obtain an interference fringe image having good contrast by shortening an optical path difference of a reference light and an object beam shorter than a coherence length of the reference light by a light quantity attenuation path matching member, and reducing a light quantity difference of the reference light and the object beam, thereby generating a light interference of the reference light and the object beam even in the case of using a light source having a short coherence length. SOLUTION: The oblique incident interferometer comprises a light source 1 for emitting a light having a short coherence length, a collimator lens 2, a first diffraction grating 3 for wave surface dividing its parallel beam, a second diffraction grating 7 incident with a reference light 4 of a zero-order diffraction light from the grating 3 and an object beam 6 from a + primary diffraction light from the grating 3 via a surface 5a to be detected to interfere a - primary diffraction light of the light 4 with the zero-order light of the beam 6, a converging lens 8, and a television camera 10. A light quantity attenuation path matching filter 11 for attenuating a light quantity of the light 4 and reducing an optical path difference of the light 4 and the beam 6 is arranged between the two gratings 3 and 7.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2000105113A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2000105113A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2000105113A3</originalsourceid><addsrcrecordid>eNrjZJD3d_LxDAx1VfD0c_Z0cfULATJCXIPcXIP8fV2BDB4G1rTEnOJUXijNzaDk5hri7KGbWpAfn1pckJicmpdaEu8VYGRgYGBoYGpoaOxoTJQiACXcIh4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OBLIQUE INCIDENT INTERFEROMETER</title><source>esp@cenet</source><creator>HIZUKA MASATOSHI ; KOBAYASHI FUMIO ; SAITO TAKAYUKI</creator><creatorcontrib>HIZUKA MASATOSHI ; KOBAYASHI FUMIO ; SAITO TAKAYUKI</creatorcontrib><description>PROBLEM TO BE SOLVED: To obtain an interference fringe image having good contrast by shortening an optical path difference of a reference light and an object beam shorter than a coherence length of the reference light by a light quantity attenuation path matching member, and reducing a light quantity difference of the reference light and the object beam, thereby generating a light interference of the reference light and the object beam even in the case of using a light source having a short coherence length. SOLUTION: The oblique incident interferometer comprises a light source 1 for emitting a light having a short coherence length, a collimator lens 2, a first diffraction grating 3 for wave surface dividing its parallel beam, a second diffraction grating 7 incident with a reference light 4 of a zero-order diffraction light from the grating 3 and an object beam 6 from a + primary diffraction light from the grating 3 via a surface 5a to be detected to interfere a - primary diffraction light of the light 4 with the zero-order light of the beam 6, a converging lens 8, and a television camera 10. A light quantity attenuation path matching filter 11 for attenuating a light quantity of the light 4 and reducing an optical path difference of the light 4 and the beam 6 is arranged between the two gratings 3 and 7.</description><edition>7</edition><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000411&amp;DB=EPODOC&amp;CC=JP&amp;NR=2000105113A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20000411&amp;DB=EPODOC&amp;CC=JP&amp;NR=2000105113A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIZUKA MASATOSHI</creatorcontrib><creatorcontrib>KOBAYASHI FUMIO</creatorcontrib><creatorcontrib>SAITO TAKAYUKI</creatorcontrib><title>OBLIQUE INCIDENT INTERFEROMETER</title><description>PROBLEM TO BE SOLVED: To obtain an interference fringe image having good contrast by shortening an optical path difference of a reference light and an object beam shorter than a coherence length of the reference light by a light quantity attenuation path matching member, and reducing a light quantity difference of the reference light and the object beam, thereby generating a light interference of the reference light and the object beam even in the case of using a light source having a short coherence length. SOLUTION: The oblique incident interferometer comprises a light source 1 for emitting a light having a short coherence length, a collimator lens 2, a first diffraction grating 3 for wave surface dividing its parallel beam, a second diffraction grating 7 incident with a reference light 4 of a zero-order diffraction light from the grating 3 and an object beam 6 from a + primary diffraction light from the grating 3 via a surface 5a to be detected to interfere a - primary diffraction light of the light 4 with the zero-order light of the beam 6, a converging lens 8, and a television camera 10. A light quantity attenuation path matching filter 11 for attenuating a light quantity of the light 4 and reducing an optical path difference of the light 4 and the beam 6 is arranged between the two gratings 3 and 7.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD3d_LxDAx1VfD0c_Z0cfULATJCXIPcXIP8fV2BDB4G1rTEnOJUXijNzaDk5hri7KGbWpAfn1pckJicmpdaEu8VYGRgYGBoYGpoaOxoTJQiACXcIh4</recordid><startdate>20000411</startdate><enddate>20000411</enddate><creator>HIZUKA MASATOSHI</creator><creator>KOBAYASHI FUMIO</creator><creator>SAITO TAKAYUKI</creator><scope>EVB</scope></search><sort><creationdate>20000411</creationdate><title>OBLIQUE INCIDENT INTERFEROMETER</title><author>HIZUKA MASATOSHI ; KOBAYASHI FUMIO ; SAITO TAKAYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2000105113A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2000</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HIZUKA MASATOSHI</creatorcontrib><creatorcontrib>KOBAYASHI FUMIO</creatorcontrib><creatorcontrib>SAITO TAKAYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIZUKA MASATOSHI</au><au>KOBAYASHI FUMIO</au><au>SAITO TAKAYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OBLIQUE INCIDENT INTERFEROMETER</title><date>2000-04-11</date><risdate>2000</risdate><abstract>PROBLEM TO BE SOLVED: To obtain an interference fringe image having good contrast by shortening an optical path difference of a reference light and an object beam shorter than a coherence length of the reference light by a light quantity attenuation path matching member, and reducing a light quantity difference of the reference light and the object beam, thereby generating a light interference of the reference light and the object beam even in the case of using a light source having a short coherence length. SOLUTION: The oblique incident interferometer comprises a light source 1 for emitting a light having a short coherence length, a collimator lens 2, a first diffraction grating 3 for wave surface dividing its parallel beam, a second diffraction grating 7 incident with a reference light 4 of a zero-order diffraction light from the grating 3 and an object beam 6 from a + primary diffraction light from the grating 3 via a surface 5a to be detected to interfere a - primary diffraction light of the light 4 with the zero-order light of the beam 6, a converging lens 8, and a television camera 10. A light quantity attenuation path matching filter 11 for attenuating a light quantity of the light 4 and reducing an optical path difference of the light 4 and the beam 6 is arranged between the two gratings 3 and 7.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title OBLIQUE INCIDENT INTERFEROMETER
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T07%3A10%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HIZUKA%20MASATOSHI&rft.date=2000-04-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2000105113A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true