SHAPE MEASURING DEVICE
PROBLEM TO BE SOLVED: To measure the geometric feature parameters such as geometric tolerances of a minute object to be measured with pores and grooves of 100 μm or less. SOLUTION: As bringing a probe 7 into contact with an object 4 to be measured from a predetermined direction under a measurement d...
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creator | HIRONO AYUMI |
description | PROBLEM TO BE SOLVED: To measure the geometric feature parameters such as geometric tolerances of a minute object to be measured with pores and grooves of 100 μm or less. SOLUTION: As bringing a probe 7 into contact with an object 4 to be measured from a predetermined direction under a measurement device coordinate system, a three-dimensional measuring device 1 acquires the three-dimensional coordinate data of the contact point. A data computing unit 100 performs coordinate transformation from the measurement device coordinate system to a reference coordinate system on the three-dimensional coordinate data through the use of the equation P0=R.Pm when R is a coordinate transformation matrix formed of a plurality of elements in four rows and four columns, Pm is the three-dimensional coordinate data acquired by the three-dimensional measuring device 1 in the measuring device coordinate system, and P0 is the three- dimensional coordinate data of the object 4 in the reference coordinate system. |
format | Patent |
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SOLUTION: As bringing a probe 7 into contact with an object 4 to be measured from a predetermined direction under a measurement device coordinate system, a three-dimensional measuring device 1 acquires the three-dimensional coordinate data of the contact point. A data computing unit 100 performs coordinate transformation from the measurement device coordinate system to a reference coordinate system on the three-dimensional coordinate data through the use of the equation P0=R.Pm when R is a coordinate transformation matrix formed of a plurality of elements in four rows and four columns, Pm is the three-dimensional coordinate data acquired by the three-dimensional measuring device 1 in the measuring device coordinate system, and P0 is the three- dimensional coordinate data of the object 4 in the reference coordinate system.</description><edition>7</edition><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20000128&DB=EPODOC&CC=JP&NR=2000028350A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20000128&DB=EPODOC&CC=JP&NR=2000028350A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIRONO AYUMI</creatorcontrib><title>SHAPE MEASURING DEVICE</title><description>PROBLEM TO BE SOLVED: To measure the geometric feature parameters such as geometric tolerances of a minute object to be measured with pores and grooves of 100 μm or less. 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A data computing unit 100 performs coordinate transformation from the measurement device coordinate system to a reference coordinate system on the three-dimensional coordinate data through the use of the equation P0=R.Pm when R is a coordinate transformation matrix formed of a plurality of elements in four rows and four columns, Pm is the three-dimensional coordinate data acquired by the three-dimensional measuring device 1 in the measuring device coordinate system, and P0 is the three- dimensional coordinate data of the object 4 in the reference coordinate system.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAL9nAMcFXwdXUMDg3y9HNXcHEN83R25WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgZAYGRhbGrgaEyUIgDl-x9l</recordid><startdate>20000128</startdate><enddate>20000128</enddate><creator>HIRONO AYUMI</creator><scope>EVB</scope></search><sort><creationdate>20000128</creationdate><title>SHAPE MEASURING DEVICE</title><author>HIRONO AYUMI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2000028350A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2000</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HIRONO AYUMI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIRONO AYUMI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SHAPE MEASURING DEVICE</title><date>2000-01-28</date><risdate>2000</risdate><abstract>PROBLEM TO BE SOLVED: To measure the geometric feature parameters such as geometric tolerances of a minute object to be measured with pores and grooves of 100 μm or less. 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subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | SHAPE MEASURING DEVICE |
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