CIRCUITO DI PROVA DI DISPOSITIVI A EFFETTO HALL
A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog-to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall ef...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | ita |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | VAN HUSEN HENDRIK W DALEY WILLIAM J |
| description | A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog-to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall effect device under test to switch between its operate and release states. The analog-to-digital conversion circuit provides a digital value, representative of the intensity of the magnetic field existing at the time of switching. These digital values are then stored in the storage circuit. The comparison circuit compares the stored switching values to predetermined thresholds and causes an appropriate visual pass/fail visual signal to be provided. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_IT1169896B</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>IT1169896B</sourcerecordid><originalsourceid>FETCH-epo_espacenet_IT1169896B3</originalsourceid><addsrcrecordid>eNrjZNB39gxyDvUM8Vdw8VQICPIPcwQxXDyDA_yDPUM8wzwVHBVc3dxcQ4AqPBx9fHgYWNMSc4pTeaE0N4M8UNLZQze1ID8-tbggMTk1L7Uk3jPE0NDM0sLSzMmYsAoAYrIlJg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CIRCUITO DI PROVA DI DISPOSITIVI A EFFETTO HALL</title><source>esp@cenet</source><creator>VAN HUSEN HENDRIK W ; DALEY WILLIAM J</creator><creatorcontrib>VAN HUSEN HENDRIK W ; DALEY WILLIAM J</creatorcontrib><description>A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog-to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall effect device under test to switch between its operate and release states. The analog-to-digital conversion circuit provides a digital value, representative of the intensity of the magnetic field existing at the time of switching. These digital values are then stored in the storage circuit. The comparison circuit compares the stored switching values to predetermined thresholds and causes an appropriate visual pass/fail visual signal to be provided.</description><edition>4</edition><language>ita</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1987</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19870603&DB=EPODOC&CC=IT&NR=1169896B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19870603&DB=EPODOC&CC=IT&NR=1169896B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VAN HUSEN HENDRIK W</creatorcontrib><creatorcontrib>DALEY WILLIAM J</creatorcontrib><title>CIRCUITO DI PROVA DI DISPOSITIVI A EFFETTO HALL</title><description>A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog-to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall effect device under test to switch between its operate and release states. The analog-to-digital conversion circuit provides a digital value, representative of the intensity of the magnetic field existing at the time of switching. These digital values are then stored in the storage circuit. The comparison circuit compares the stored switching values to predetermined thresholds and causes an appropriate visual pass/fail visual signal to be provided.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1987</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB39gxyDvUM8Vdw8VQICPIPcwQxXDyDA_yDPUM8wzwVHBVc3dxcQ4AqPBx9fHgYWNMSc4pTeaE0N4M8UNLZQze1ID8-tbggMTk1L7Uk3jPE0NDM0sLSzMmYsAoAYrIlJg</recordid><startdate>19870603</startdate><enddate>19870603</enddate><creator>VAN HUSEN HENDRIK W</creator><creator>DALEY WILLIAM J</creator><scope>EVB</scope></search><sort><creationdate>19870603</creationdate><title>CIRCUITO DI PROVA DI DISPOSITIVI A EFFETTO HALL</title><author>VAN HUSEN HENDRIK W ; DALEY WILLIAM J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_IT1169896B3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>ita</language><creationdate>1987</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>VAN HUSEN HENDRIK W</creatorcontrib><creatorcontrib>DALEY WILLIAM J</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VAN HUSEN HENDRIK W</au><au>DALEY WILLIAM J</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CIRCUITO DI PROVA DI DISPOSITIVI A EFFETTO HALL</title><date>1987-06-03</date><risdate>1987</risdate><abstract>A Hall effect device test circuit which detects Hall effect device operate and release point failures. A magnetic field circuit, an analog-to-digital conversion circuit, a storage circuit, a comparison circuit and a visual indicator circuit are included. The magnetic field circuit causes the Hall effect device under test to switch between its operate and release states. The analog-to-digital conversion circuit provides a digital value, representative of the intensity of the magnetic field existing at the time of switching. These digital values are then stored in the storage circuit. The comparison circuit compares the stored switching values to predetermined thresholds and causes an appropriate visual pass/fail visual signal to be provided.</abstract><edition>4</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | ita |
| recordid | cdi_epo_espacenet_IT1169896B |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | CIRCUITO DI PROVA DI DISPOSITIVI A EFFETTO HALL |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T03%3A58%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=VAN%20HUSEN%20HENDRIK%20W&rft.date=1987-06-03&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EIT1169896B%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |