Imaging method and metrology device

Disclosed is an imaging method comprising obtaining a set of primary deconvolution kernels or a set of impulse responses relating to an optical system used to capture said image; obtaining said image signal, said image signal being subject to one or more imaging effects including at least one or mor...

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Hauptverfasser: KONIJNENBERG Alexander Prasetya, COENE Willem Marie Julia Marcel, VAN KRAAIJ Markus Gerardus Martinus Maria, DEN BOEF Arie Jeffrey
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Sprache:eng ; heb
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creator KONIJNENBERG Alexander Prasetya
COENE Willem Marie Julia Marcel
VAN KRAAIJ Markus Gerardus Martinus Maria
DEN BOEF Arie Jeffrey
description Disclosed is an imaging method comprising obtaining a set of primary deconvolution kernels or a set of impulse responses relating to an optical system used to capture said image; obtaining said image signal, said image signal being subject to one or more imaging effects including at least one or more non-isoplanatic imaging effects; performing a low-rank approximation on said set of primary deconvolution kernels or impulse responses to determine respectively a set of deconvolution modes or a set of impulse response modes, each deconvolution mode comprising a modal secondary deconvolution kernel and a modal weight function and each impulse response mode comprising a modal impulse response and a modal inverse weight function; obtaining at least approximated imaging effect-free object information related to said object by applying said modal secondary deconvolution kernels and modal weight functions or said modal impulse responses and modal inverse weight functions to said image signal.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_IL315683A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>IL315683A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_IL315683A3</originalsourceid><addsrcrecordid>eNrjZFD2zE1Mz8xLV8hNLcnIT1FIzEsBMYvyc_LTKxVSUssyk1N5GFjTEnOKU3mhNDeDnJtriLOHbmpBfnxqcUFicmpeakm8p4-xoamZhbGjMUEFAPqaJSI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Imaging method and metrology device</title><source>esp@cenet</source><creator>KONIJNENBERG Alexander Prasetya ; COENE Willem Marie Julia Marcel ; VAN KRAAIJ Markus Gerardus Martinus Maria ; DEN BOEF Arie Jeffrey</creator><creatorcontrib>KONIJNENBERG Alexander Prasetya ; COENE Willem Marie Julia Marcel ; VAN KRAAIJ Markus Gerardus Martinus Maria ; DEN BOEF Arie Jeffrey</creatorcontrib><description>Disclosed is an imaging method comprising obtaining a set of primary deconvolution kernels or a set of impulse responses relating to an optical system used to capture said image; obtaining said image signal, said image signal being subject to one or more imaging effects including at least one or more non-isoplanatic imaging effects; performing a low-rank approximation on said set of primary deconvolution kernels or impulse responses to determine respectively a set of deconvolution modes or a set of impulse response modes, each deconvolution mode comprising a modal secondary deconvolution kernel and a modal weight function and each impulse response mode comprising a modal impulse response and a modal inverse weight function; obtaining at least approximated imaging effect-free object information related to said object by applying said modal secondary deconvolution kernels and modal weight functions or said modal impulse responses and modal inverse weight functions to said image signal.</description><language>eng ; heb</language><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241101&amp;DB=EPODOC&amp;CC=IL&amp;NR=315683A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241101&amp;DB=EPODOC&amp;CC=IL&amp;NR=315683A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KONIJNENBERG Alexander Prasetya</creatorcontrib><creatorcontrib>COENE Willem Marie Julia Marcel</creatorcontrib><creatorcontrib>VAN KRAAIJ Markus Gerardus Martinus Maria</creatorcontrib><creatorcontrib>DEN BOEF Arie Jeffrey</creatorcontrib><title>Imaging method and metrology device</title><description>Disclosed is an imaging method comprising obtaining a set of primary deconvolution kernels or a set of impulse responses relating to an optical system used to capture said image; obtaining said image signal, said image signal being subject to one or more imaging effects including at least one or more non-isoplanatic imaging effects; performing a low-rank approximation on said set of primary deconvolution kernels or impulse responses to determine respectively a set of deconvolution modes or a set of impulse response modes, each deconvolution mode comprising a modal secondary deconvolution kernel and a modal weight function and each impulse response mode comprising a modal impulse response and a modal inverse weight function; obtaining at least approximated imaging effect-free object information related to said object by applying said modal secondary deconvolution kernels and modal weight functions or said modal impulse responses and modal inverse weight functions to said image signal.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD2zE1Mz8xLV8hNLcnIT1FIzEsBMYvyc_LTKxVSUssyk1N5GFjTEnOKU3mhNDeDnJtriLOHbmpBfnxqcUFicmpeakm8p4-xoamZhbGjMUEFAPqaJSI</recordid><startdate>20241101</startdate><enddate>20241101</enddate><creator>KONIJNENBERG Alexander Prasetya</creator><creator>COENE Willem Marie Julia Marcel</creator><creator>VAN KRAAIJ Markus Gerardus Martinus Maria</creator><creator>DEN BOEF Arie Jeffrey</creator><scope>EVB</scope></search><sort><creationdate>20241101</creationdate><title>Imaging method and metrology device</title><author>KONIJNENBERG Alexander Prasetya ; COENE Willem Marie Julia Marcel ; VAN KRAAIJ Markus Gerardus Martinus Maria ; DEN BOEF Arie Jeffrey</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_IL315683A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; heb</language><creationdate>2024</creationdate><toplevel>online_resources</toplevel><creatorcontrib>KONIJNENBERG Alexander Prasetya</creatorcontrib><creatorcontrib>COENE Willem Marie Julia Marcel</creatorcontrib><creatorcontrib>VAN KRAAIJ Markus Gerardus Martinus Maria</creatorcontrib><creatorcontrib>DEN BOEF Arie Jeffrey</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KONIJNENBERG Alexander Prasetya</au><au>COENE Willem Marie Julia Marcel</au><au>VAN KRAAIJ Markus Gerardus Martinus Maria</au><au>DEN BOEF Arie Jeffrey</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Imaging method and metrology device</title><date>2024-11-01</date><risdate>2024</risdate><abstract>Disclosed is an imaging method comprising obtaining a set of primary deconvolution kernels or a set of impulse responses relating to an optical system used to capture said image; obtaining said image signal, said image signal being subject to one or more imaging effects including at least one or more non-isoplanatic imaging effects; performing a low-rank approximation on said set of primary deconvolution kernels or impulse responses to determine respectively a set of deconvolution modes or a set of impulse response modes, each deconvolution mode comprising a modal secondary deconvolution kernel and a modal weight function and each impulse response mode comprising a modal impulse response and a modal inverse weight function; obtaining at least approximated imaging effect-free object information related to said object by applying said modal secondary deconvolution kernels and modal weight functions or said modal impulse responses and modal inverse weight functions to said image signal.</abstract><oa>free_for_read</oa></addata></record>
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title Imaging method and metrology device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T08%3A52%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KONIJNENBERG%20Alexander%20Prasetya&rft.date=2024-11-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EIL315683A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true