CIRCUIT ARRANGEMENT FOR REALIZING TWO-DIMENSIONAL REFRESHMENT DURING THE TEST OF THE HIGH CAPACITY DYNAMIC MEMORY CIRCUITS

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: OLAH,CSABA,HU, BEKE,LASZLO,HU, KERI,DANIEL,HU, SZEKELY,ISTVAN,HU, VENER,PETER,HU, DIHN XUAN,THO,HU, TAKACS,FERENC,HU, DEKANY,BELA,HU, TOMAN,GYOERGY,HU, SZARKA,ANDRAS,HU, BARTOS,IMRE,HU, SZENCZI,ARPAD,HU, SZEPHEGYI,ATTILA,HU
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator OLAH,CSABA,HU
BEKE,LASZLO,HU
KERI,DANIEL,HU
SZEKELY,ISTVAN,HU
VENER,PETER,HU
DIHN XUAN,THO,HU
TAKACS,FERENC,HU
DEKANY,BELA,HU
TOMAN,GYOERGY,HU
SZARKA,ANDRAS,HU
BARTOS,IMRE,HU
SZENCZI,ARPAD,HU
SZEPHEGYI,ATTILA,HU
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_HU205462B</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>HU205462B</sourcerecordid><originalsourceid>FETCH-epo_espacenet_HU205462B3</originalsourceid><addsrcrecordid>eNqFjb0KwjAURrs4iPoKcl-gIPVnj-lNc6FJ5CZB6lKKxEm0UCef3lK6O30HzoFvmX0lsYwUQDALW6FBG0A5BkZR041sBeHq8pJG4clZUY9GMXo9lWXkKdEIAX0ApybWVGmQ4iIkhQbKxgpDEgwaxw3Mj36dLR7dc0ibeVfZVmGQOk_9u01D393TK31aHYvd8XAqzvu_wQ_jsjmd</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CIRCUIT ARRANGEMENT FOR REALIZING TWO-DIMENSIONAL REFRESHMENT DURING THE TEST OF THE HIGH CAPACITY DYNAMIC MEMORY CIRCUITS</title><source>esp@cenet</source><creator>OLAH,CSABA,HU ; BEKE,LASZLO,HU ; KERI,DANIEL,HU ; SZEKELY,ISTVAN,HU ; VENER,PETER,HU ; DIHN XUAN,THO,HU ; TAKACS,FERENC,HU ; DEKANY,BELA,HU ; TOMAN,GYOERGY,HU ; SZARKA,ANDRAS,HU ; BARTOS,IMRE,HU ; SZENCZI,ARPAD,HU ; SZEPHEGYI,ATTILA,HU</creator><creatorcontrib>OLAH,CSABA,HU ; BEKE,LASZLO,HU ; KERI,DANIEL,HU ; SZEKELY,ISTVAN,HU ; VENER,PETER,HU ; DIHN XUAN,THO,HU ; TAKACS,FERENC,HU ; DEKANY,BELA,HU ; TOMAN,GYOERGY,HU ; SZARKA,ANDRAS,HU ; BARTOS,IMRE,HU ; SZENCZI,ARPAD,HU ; SZEPHEGYI,ATTILA,HU</creatorcontrib><edition>5</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL ; METERING BY VOLUME ; PHYSICS ; TESTING</subject><creationdate>1992</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19920428&amp;DB=EPODOC&amp;CC=HU&amp;NR=205462B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19920428&amp;DB=EPODOC&amp;CC=HU&amp;NR=205462B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OLAH,CSABA,HU</creatorcontrib><creatorcontrib>BEKE,LASZLO,HU</creatorcontrib><creatorcontrib>KERI,DANIEL,HU</creatorcontrib><creatorcontrib>SZEKELY,ISTVAN,HU</creatorcontrib><creatorcontrib>VENER,PETER,HU</creatorcontrib><creatorcontrib>DIHN XUAN,THO,HU</creatorcontrib><creatorcontrib>TAKACS,FERENC,HU</creatorcontrib><creatorcontrib>DEKANY,BELA,HU</creatorcontrib><creatorcontrib>TOMAN,GYOERGY,HU</creatorcontrib><creatorcontrib>SZARKA,ANDRAS,HU</creatorcontrib><creatorcontrib>BARTOS,IMRE,HU</creatorcontrib><creatorcontrib>SZENCZI,ARPAD,HU</creatorcontrib><creatorcontrib>SZEPHEGYI,ATTILA,HU</creatorcontrib><title>CIRCUIT ARRANGEMENT FOR REALIZING TWO-DIMENSIONAL REFRESHMENT DURING THE TEST OF THE HIGH CAPACITY DYNAMIC MEMORY CIRCUITS</title><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL</subject><subject>METERING BY VOLUME</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1992</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqFjb0KwjAURrs4iPoKcl-gIPVnj-lNc6FJ5CZB6lKKxEm0UCef3lK6O30HzoFvmX0lsYwUQDALW6FBG0A5BkZR041sBeHq8pJG4clZUY9GMXo9lWXkKdEIAX0ApybWVGmQ4iIkhQbKxgpDEgwaxw3Mj36dLR7dc0ibeVfZVmGQOk_9u01D393TK31aHYvd8XAqzvu_wQ_jsjmd</recordid><startdate>19920428</startdate><enddate>19920428</enddate><creator>OLAH,CSABA,HU</creator><creator>BEKE,LASZLO,HU</creator><creator>KERI,DANIEL,HU</creator><creator>SZEKELY,ISTVAN,HU</creator><creator>VENER,PETER,HU</creator><creator>DIHN XUAN,THO,HU</creator><creator>TAKACS,FERENC,HU</creator><creator>DEKANY,BELA,HU</creator><creator>TOMAN,GYOERGY,HU</creator><creator>SZARKA,ANDRAS,HU</creator><creator>BARTOS,IMRE,HU</creator><creator>SZENCZI,ARPAD,HU</creator><creator>SZEPHEGYI,ATTILA,HU</creator><scope>EVB</scope></search><sort><creationdate>19920428</creationdate><title>CIRCUIT ARRANGEMENT FOR REALIZING TWO-DIMENSIONAL REFRESHMENT DURING THE TEST OF THE HIGH CAPACITY DYNAMIC MEMORY CIRCUITS</title><author>OLAH,CSABA,HU ; BEKE,LASZLO,HU ; KERI,DANIEL,HU ; SZEKELY,ISTVAN,HU ; VENER,PETER,HU ; DIHN XUAN,THO,HU ; TAKACS,FERENC,HU ; DEKANY,BELA,HU ; TOMAN,GYOERGY,HU ; SZARKA,ANDRAS,HU ; BARTOS,IMRE,HU ; SZENCZI,ARPAD,HU ; SZEPHEGYI,ATTILA,HU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_HU205462B3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1992</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL</topic><topic>METERING BY VOLUME</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OLAH,CSABA,HU</creatorcontrib><creatorcontrib>BEKE,LASZLO,HU</creatorcontrib><creatorcontrib>KERI,DANIEL,HU</creatorcontrib><creatorcontrib>SZEKELY,ISTVAN,HU</creatorcontrib><creatorcontrib>VENER,PETER,HU</creatorcontrib><creatorcontrib>DIHN XUAN,THO,HU</creatorcontrib><creatorcontrib>TAKACS,FERENC,HU</creatorcontrib><creatorcontrib>DEKANY,BELA,HU</creatorcontrib><creatorcontrib>TOMAN,GYOERGY,HU</creatorcontrib><creatorcontrib>SZARKA,ANDRAS,HU</creatorcontrib><creatorcontrib>BARTOS,IMRE,HU</creatorcontrib><creatorcontrib>SZENCZI,ARPAD,HU</creatorcontrib><creatorcontrib>SZEPHEGYI,ATTILA,HU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OLAH,CSABA,HU</au><au>BEKE,LASZLO,HU</au><au>KERI,DANIEL,HU</au><au>SZEKELY,ISTVAN,HU</au><au>VENER,PETER,HU</au><au>DIHN XUAN,THO,HU</au><au>TAKACS,FERENC,HU</au><au>DEKANY,BELA,HU</au><au>TOMAN,GYOERGY,HU</au><au>SZARKA,ANDRAS,HU</au><au>BARTOS,IMRE,HU</au><au>SZENCZI,ARPAD,HU</au><au>SZEPHEGYI,ATTILA,HU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CIRCUIT ARRANGEMENT FOR REALIZING TWO-DIMENSIONAL REFRESHMENT DURING THE TEST OF THE HIGH CAPACITY DYNAMIC MEMORY CIRCUITS</title><date>1992-04-28</date><risdate>1992</risdate><edition>5</edition><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_HU205462B
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL
METERING BY VOLUME
PHYSICS
TESTING
title CIRCUIT ARRANGEMENT FOR REALIZING TWO-DIMENSIONAL REFRESHMENT DURING THE TEST OF THE HIGH CAPACITY DYNAMIC MEMORY CIRCUITS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T12%3A22%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OLAH,CSABA,HU&rft.date=1992-04-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EHU205462B%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true