SCALABLE ELECTRICALLY ERASEABLE AND PROGRAMMABLE MEMORY

A non-volatile memory including one or more EEPROM cell pairs. Each EEPROM cell pair includes three transistors and stores two data bits, effectively providing a 1.5 transistor EEPROM cell. An EEPROM cell pair includes a first non-volatile memory transistor, a second non-volatile memory transistor a...

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Hauptverfasser: COSMIN, PETER, SMARANDOIU, GEORGE, GEORGESCU, SORIN S
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creator COSMIN, PETER
SMARANDOIU, GEORGE
GEORGESCU, SORIN S
description A non-volatile memory including one or more EEPROM cell pairs. Each EEPROM cell pair includes three transistors and stores two data bits, effectively providing a 1.5 transistor EEPROM cell. An EEPROM cell pair includes a first non-volatile memory transistor, a second non-volatile memory transistor and a source access transistor. The source access transistor includes: a first source region continuous with a source region of the first non-volatile memory transistor; a second source region continuous with a source region of the second non-volatile memory transistor, and a drain region that extends downward through a first well region to contact a second well region. The first, second and third semiconductor regions and the second well region have a first conductivity type, and the first well region has a second conductivity type, opposite the first conductivity type.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_HK1133121A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>HK1133121A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_HK1133121A13</originalsourceid><addsrcrecordid>eNrjZDAPdnb0cXTycVVw9XF1DgnyBHJ9IhVcgxyDXcHCjn4uCgFB_u5Bjr6-YAFfV1__oEgeBta0xJziVF4ozc2g4OYa4uyhm1qQH59aXJCYnJqXWhLv4W1oaGxsaGToaGhMhBIA4Csnlw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SCALABLE ELECTRICALLY ERASEABLE AND PROGRAMMABLE MEMORY</title><source>esp@cenet</source><creator>COSMIN, PETER ; SMARANDOIU, GEORGE ; GEORGESCU, SORIN S</creator><creatorcontrib>COSMIN, PETER ; SMARANDOIU, GEORGE ; GEORGESCU, SORIN S</creatorcontrib><description>A non-volatile memory including one or more EEPROM cell pairs. Each EEPROM cell pair includes three transistors and stores two data bits, effectively providing a 1.5 transistor EEPROM cell. An EEPROM cell pair includes a first non-volatile memory transistor, a second non-volatile memory transistor and a source access transistor. The source access transistor includes: a first source region continuous with a source region of the first non-volatile memory transistor; a second source region continuous with a source region of the second non-volatile memory transistor, and a drain region that extends downward through a first well region to contact a second well region. The first, second and third semiconductor regions and the second well region have a first conductivity type, and the first well region has a second conductivity type, opposite the first conductivity type.</description><language>eng</language><subject>ELECTRICITY</subject><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20100312&amp;DB=EPODOC&amp;CC=HK&amp;NR=1133121A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20100312&amp;DB=EPODOC&amp;CC=HK&amp;NR=1133121A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>COSMIN, PETER</creatorcontrib><creatorcontrib>SMARANDOIU, GEORGE</creatorcontrib><creatorcontrib>GEORGESCU, SORIN S</creatorcontrib><title>SCALABLE ELECTRICALLY ERASEABLE AND PROGRAMMABLE MEMORY</title><description>A non-volatile memory including one or more EEPROM cell pairs. Each EEPROM cell pair includes three transistors and stores two data bits, effectively providing a 1.5 transistor EEPROM cell. An EEPROM cell pair includes a first non-volatile memory transistor, a second non-volatile memory transistor and a source access transistor. The source access transistor includes: a first source region continuous with a source region of the first non-volatile memory transistor; a second source region continuous with a source region of the second non-volatile memory transistor, and a drain region that extends downward through a first well region to contact a second well region. The first, second and third semiconductor regions and the second well region have a first conductivity type, and the first well region has a second conductivity type, opposite the first conductivity type.</description><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAPdnb0cXTycVVw9XF1DgnyBHJ9IhVcgxyDXcHCjn4uCgFB_u5Bjr6-YAFfV1__oEgeBta0xJziVF4ozc2g4OYa4uyhm1qQH59aXJCYnJqXWhLv4W1oaGxsaGToaGhMhBIA4Csnlw</recordid><startdate>20100312</startdate><enddate>20100312</enddate><creator>COSMIN, PETER</creator><creator>SMARANDOIU, GEORGE</creator><creator>GEORGESCU, SORIN S</creator><scope>EVB</scope></search><sort><creationdate>20100312</creationdate><title>SCALABLE ELECTRICALLY ERASEABLE AND PROGRAMMABLE MEMORY</title><author>COSMIN, PETER ; SMARANDOIU, GEORGE ; GEORGESCU, SORIN S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_HK1133121A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>COSMIN, PETER</creatorcontrib><creatorcontrib>SMARANDOIU, GEORGE</creatorcontrib><creatorcontrib>GEORGESCU, SORIN S</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>COSMIN, PETER</au><au>SMARANDOIU, GEORGE</au><au>GEORGESCU, SORIN S</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SCALABLE ELECTRICALLY ERASEABLE AND PROGRAMMABLE MEMORY</title><date>2010-03-12</date><risdate>2010</risdate><abstract>A non-volatile memory including one or more EEPROM cell pairs. Each EEPROM cell pair includes three transistors and stores two data bits, effectively providing a 1.5 transistor EEPROM cell. An EEPROM cell pair includes a first non-volatile memory transistor, a second non-volatile memory transistor and a source access transistor. The source access transistor includes: a first source region continuous with a source region of the first non-volatile memory transistor; a second source region continuous with a source region of the second non-volatile memory transistor, and a drain region that extends downward through a first well region to contact a second well region. The first, second and third semiconductor regions and the second well region have a first conductivity type, and the first well region has a second conductivity type, opposite the first conductivity type.</abstract><oa>free_for_read</oa></addata></record>
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title SCALABLE ELECTRICALLY ERASEABLE AND PROGRAMMABLE MEMORY
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T21%3A52%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=COSMIN,%20PETER&rft.date=2010-03-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EHK1133121A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true