Allocating sample analysis tasks to analytical devices to comply with control target
A method of allocating a plurality of functional tasks 100 to a plurality of functional devices 102 each capable of carrying out one or more of said functional tasks 100. Wherein said functional devices are analytical devices and each of said functional tasks corresponds to a respective predefined p...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Stefan Mittrich Kyle Robert Busch Udo Herynek |
description | A method of allocating a plurality of functional tasks 100 to a plurality of functional devices 102 each capable of carrying out one or more of said functional tasks 100. Wherein said functional devices are analytical devices and each of said functional tasks corresponds to a respective predefined process related to analysing a respective sample by a respective one of said functional devices. Wherein the method comprises allocating the functional tasks to the functional devices based on a criterion to achieve compliance with at least one predefined control target of controlling the functional devices. The control target may be based on wear and tear and be used to schedule maintenance. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2623320A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2623320A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2623320A3</originalsourceid><addsrcrecordid>eNqFi0sKAjEQRLNxIeoZ7AsIkoD7UfwcYPZDE9uxsScJ040ytzeoezdVxePV3LWNSI5onHpQHIoQYEKZlBUM9VEzf4lxRIErPTnSh8Zc9QlebPe6k41Z6mXsyZZudkNRWv164danY3u4bKjkjrRgpETWnfd-50Pw2yb8N971XThY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Allocating sample analysis tasks to analytical devices to comply with control target</title><source>esp@cenet</source><creator>Stefan Mittrich ; Kyle Robert Busch ; Udo Herynek</creator><creatorcontrib>Stefan Mittrich ; Kyle Robert Busch ; Udo Herynek</creatorcontrib><description>A method of allocating a plurality of functional tasks 100 to a plurality of functional devices 102 each capable of carrying out one or more of said functional tasks 100. Wherein said functional devices are analytical devices and each of said functional tasks corresponds to a respective predefined process related to analysing a respective sample by a respective one of said functional devices. Wherein the method comprises allocating the functional tasks to the functional devices based on a criterion to achieve compliance with at least one predefined control target of controlling the functional devices. The control target may be based on wear and tear and be used to schedule maintenance.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; PHYSICS ; SEPARATION ; TESTING ; TRANSPORTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240417&DB=EPODOC&CC=GB&NR=2623320A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240417&DB=EPODOC&CC=GB&NR=2623320A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Stefan Mittrich</creatorcontrib><creatorcontrib>Kyle Robert Busch</creatorcontrib><creatorcontrib>Udo Herynek</creatorcontrib><title>Allocating sample analysis tasks to analytical devices to comply with control target</title><description>A method of allocating a plurality of functional tasks 100 to a plurality of functional devices 102 each capable of carrying out one or more of said functional tasks 100. Wherein said functional devices are analytical devices and each of said functional tasks corresponds to a respective predefined process related to analysing a respective sample by a respective one of said functional devices. Wherein the method comprises allocating the functional tasks to the functional devices based on a criterion to achieve compliance with at least one predefined control target of controlling the functional devices. The control target may be based on wear and tear and be used to schedule maintenance.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>PHYSICS</subject><subject>SEPARATION</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqFi0sKAjEQRLNxIeoZ7AsIkoD7UfwcYPZDE9uxsScJ040ytzeoezdVxePV3LWNSI5onHpQHIoQYEKZlBUM9VEzf4lxRIErPTnSh8Zc9QlebPe6k41Z6mXsyZZudkNRWv164danY3u4bKjkjrRgpETWnfd-50Pw2yb8N971XThY</recordid><startdate>20240417</startdate><enddate>20240417</enddate><creator>Stefan Mittrich</creator><creator>Kyle Robert Busch</creator><creator>Udo Herynek</creator><scope>EVB</scope></search><sort><creationdate>20240417</creationdate><title>Allocating sample analysis tasks to analytical devices to comply with control target</title><author>Stefan Mittrich ; Kyle Robert Busch ; Udo Herynek</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2623320A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>PHYSICS</topic><topic>SEPARATION</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Stefan Mittrich</creatorcontrib><creatorcontrib>Kyle Robert Busch</creatorcontrib><creatorcontrib>Udo Herynek</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Stefan Mittrich</au><au>Kyle Robert Busch</au><au>Udo Herynek</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Allocating sample analysis tasks to analytical devices to comply with control target</title><date>2024-04-17</date><risdate>2024</risdate><abstract>A method of allocating a plurality of functional tasks 100 to a plurality of functional devices 102 each capable of carrying out one or more of said functional tasks 100. Wherein said functional devices are analytical devices and each of said functional tasks corresponds to a respective predefined process related to analysing a respective sample by a respective one of said functional devices. Wherein the method comprises allocating the functional tasks to the functional devices based on a criterion to achieve compliance with at least one predefined control target of controlling the functional devices. The control target may be based on wear and tear and be used to schedule maintenance.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_GB2623320A |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS SEPARATION TESTING TRANSPORTING |
title | Allocating sample analysis tasks to analytical devices to comply with control target |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T18%3A07%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Stefan%20Mittrich&rft.date=2024-04-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EGB2623320A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |