Method to reduce measurement bias
A method of mass analysing a single analytical sample is disclosed comprising: i) transmitting different species of ions through a mass spectrometer; ii) sequentially mass analysing, or otherwise detecting, said different species of ions in a particular sequential order; and then iii) repeating step...
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creator | Richard Moulds David Gordon |
description | A method of mass analysing a single analytical sample is disclosed comprising: i) transmitting different species of ions through a mass spectrometer; ii) sequentially mass analysing, or otherwise detecting, said different species of ions in a particular sequential order; and then iii) repeating steps i) and ii), wherein the sequential order in which said different species of ions are mass analysed, or otherwise detected, is different when step ii) is repeated. The sensitivity with which the mass spectrometer is able to detect ions varies for a period of time, and step ii) and iii) are performed during that period of time. |
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The sensitivity with which the mass spectrometer is able to detect ions varies for a period of time, and step ii) and iii) are performed during that period of time.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD0TS3JyE9RKMlXKEpNKU1OVchNTSwuLUrNTc0rUUjKTCzmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXx7k5GZoZm5gZGTsaEVQAA5QMkpw</recordid><startdate>20240313</startdate><enddate>20240313</enddate><creator>Richard Moulds</creator><creator>David Gordon</creator><scope>EVB</scope></search><sort><creationdate>20240313</creationdate><title>Method to reduce measurement bias</title><author>Richard Moulds ; David Gordon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2616702B3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>Richard Moulds</creatorcontrib><creatorcontrib>David Gordon</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Richard Moulds</au><au>David Gordon</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method to reduce measurement bias</title><date>2024-03-13</date><risdate>2024</risdate><abstract>A method of mass analysing a single analytical sample is disclosed comprising: i) transmitting different species of ions through a mass spectrometer; ii) sequentially mass analysing, or otherwise detecting, said different species of ions in a particular sequential order; and then iii) repeating steps i) and ii), wherein the sequential order in which said different species of ions are mass analysed, or otherwise detected, is different when step ii) is repeated. The sensitivity with which the mass spectrometer is able to detect ions varies for a period of time, and step ii) and iii) are performed during that period of time.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
title | Method to reduce measurement bias |
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