System and method for dimensioning objects

System and method for dimensioning objects

A computing device for dimensioning an object includes: a dimensioning subsystem configured to execute a default dimensioning method and a backup dimensioning method; a memory storing quality evaluation rules; a processor connected with the dimensioning subsystem and the memory, the processor config...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Raghavendra Tenkasi Shankar, Seth David Silk, Patrick B Tilley
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Raghavendra Tenkasi Shankar
Seth David Silk
Patrick B Tilley
description A computing device for dimensioning an object includes: a dimensioning subsystem configured to execute a default dimensioning method and a backup dimensioning method; a memory storing quality evaluation rules; a processor connected with the dimensioning subsystem and the memory, the processor configured to: control the dimensioning subsystem to execute a default dimensioning method to obtain default dimensioning data; compare a quality metric for the default dimensioning data to a threshold condition defined in the quality evaluation rules; when the quality metric exceeds the threshold condition, compute dimensions of the object based on the default dimensioning data; and when the quality metric does not exceed the threshold condition, control the dimensioning subsystem to execute the backup dimensioning method to obtain backup dimensioning data and compute the dimensions of the object based on the backup dimensioning data.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2610953B</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2610953B</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2610953B3</originalsourceid><addsrcrecordid>eNrjZNAKriwuSc1VSMxLUchNLcnIT1FIyy9SSMnMTc0rzszPy8xLV8hPykpNLinmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXx7k5GZoYGlqbGTsaEVQAAmCkoQQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method for dimensioning objects</title><source>esp@cenet</source><creator>Raghavendra Tenkasi Shankar ; Seth David Silk ; Patrick B Tilley</creator><creatorcontrib>Raghavendra Tenkasi Shankar ; Seth David Silk ; Patrick B Tilley</creatorcontrib><description>A computing device for dimensioning an object includes: a dimensioning subsystem configured to execute a default dimensioning method and a backup dimensioning method; a memory storing quality evaluation rules; a processor connected with the dimensioning subsystem and the memory, the processor configured to: control the dimensioning subsystem to execute a default dimensioning method to obtain default dimensioning data; compare a quality metric for the default dimensioning data to a threshold condition defined in the quality evaluation rules; when the quality metric exceeds the threshold condition, compute dimensions of the object based on the default dimensioning data; and when the quality metric does not exceed the threshold condition, control the dimensioning subsystem to execute the backup dimensioning method to obtain backup dimensioning data and compute the dimensions of the object based on the backup dimensioning data.</description><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240327&amp;DB=EPODOC&amp;CC=GB&amp;NR=2610953B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240327&amp;DB=EPODOC&amp;CC=GB&amp;NR=2610953B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Raghavendra Tenkasi Shankar</creatorcontrib><creatorcontrib>Seth David Silk</creatorcontrib><creatorcontrib>Patrick B Tilley</creatorcontrib><title>System and method for dimensioning objects</title><description>A computing device for dimensioning an object includes: a dimensioning subsystem configured to execute a default dimensioning method and a backup dimensioning method; a memory storing quality evaluation rules; a processor connected with the dimensioning subsystem and the memory, the processor configured to: control the dimensioning subsystem to execute a default dimensioning method to obtain default dimensioning data; compare a quality metric for the default dimensioning data to a threshold condition defined in the quality evaluation rules; when the quality metric exceeds the threshold condition, compute dimensions of the object based on the default dimensioning data; and when the quality metric does not exceed the threshold condition, control the dimensioning subsystem to execute the backup dimensioning method to obtain backup dimensioning data and compute the dimensions of the object based on the backup dimensioning data.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAKriwuSc1VSMxLUchNLcnIT1FIyy9SSMnMTc0rzszPy8xLV8hPykpNLinmYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXx7k5GZoYGlqbGTsaEVQAAmCkoQQ</recordid><startdate>20240327</startdate><enddate>20240327</enddate><creator>Raghavendra Tenkasi Shankar</creator><creator>Seth David Silk</creator><creator>Patrick B Tilley</creator><scope>EVB</scope></search><sort><creationdate>20240327</creationdate><title>System and method for dimensioning objects</title><author>Raghavendra Tenkasi Shankar ; Seth David Silk ; Patrick B Tilley</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2610953B3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Raghavendra Tenkasi Shankar</creatorcontrib><creatorcontrib>Seth David Silk</creatorcontrib><creatorcontrib>Patrick B Tilley</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Raghavendra Tenkasi Shankar</au><au>Seth David Silk</au><au>Patrick B Tilley</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method for dimensioning objects</title><date>2024-03-27</date><risdate>2024</risdate><abstract>A computing device for dimensioning an object includes: a dimensioning subsystem configured to execute a default dimensioning method and a backup dimensioning method; a memory storing quality evaluation rules; a processor connected with the dimensioning subsystem and the memory, the processor configured to: control the dimensioning subsystem to execute a default dimensioning method to obtain default dimensioning data; compare a quality metric for the default dimensioning data to a threshold condition defined in the quality evaluation rules; when the quality metric exceeds the threshold condition, compute dimensions of the object based on the default dimensioning data; and when the quality metric does not exceed the threshold condition, control the dimensioning subsystem to execute the backup dimensioning method to obtain backup dimensioning data and compute the dimensions of the object based on the backup dimensioning data.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_GB2610953B
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title System and method for dimensioning objects
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T00%3A44%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Raghavendra%20Tenkasi%20Shankar&rft.date=2024-03-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EGB2610953B%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true