Diagnostic enhancement for multiple instances of identical structures

A method includes executing a test against a first structure and a second structure of a built-in self-test circuit. Each of the first and second structures include a plurality of latches arranged as a plurality of stump chains. The method also includes unloading a first result of the test from the...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Orazio Pasquale Forlenza, Steven Michael Douskey, Gerard Michael Salem, Mary P. Kusko, Franco Motika
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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