Scanning probe sensor

Scanning probe sensor

A scanning probe sensor (100) for a scanning probe microscope (110) comprising a probe tip (120) having a ferromagnetic fluid (125) and a magnetic field generator (130) adapted to generate a magnetic field acting on the ferromagnetic fluid (125). Furthermore, a sensor controller (150) is provided an...

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Hauptverfasser: Bernd W Gotsmann, Fabian Menges, Pio Peter Niraj Nirmalraj
Format: Patent
Sprache:eng
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APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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creator Bernd W Gotsmann
Fabian Menges
Pio Peter Niraj Nirmalraj
description A scanning probe sensor (100) for a scanning probe microscope (110) comprising a probe tip (120) having a ferromagnetic fluid (125) and a magnetic field generator (130) adapted to generate a magnetic field acting on the ferromagnetic fluid (125). Furthermore, a sensor controller (150) is provided and configured to control one or more parameters of the magnetic field generator (130), thereby controlling the shape of the fluid (125).
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2559529A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2559529A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2559529A3</originalsourceid><addsrcrecordid>eNrjZBANTk7My8vMS1coKMpPSlUoTs0rzi_iYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXx7k5GpqaWpkaWjsaEVQAA94AgVQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Scanning probe sensor</title><source>esp@cenet</source><creator>Bernd W Gotsmann ; Fabian Menges ; Pio Peter Niraj Nirmalraj</creator><creatorcontrib>Bernd W Gotsmann ; Fabian Menges ; Pio Peter Niraj Nirmalraj</creatorcontrib><description>A scanning probe sensor (100) for a scanning probe microscope (110) comprising a probe tip (120) having a ferromagnetic fluid (125) and a magnetic field generator (130) adapted to generate a magnetic field acting on the ferromagnetic fluid (125). Furthermore, a sensor controller (150) is provided and configured to control one or more parameters of the magnetic field generator (130), thereby controlling the shape of the fluid (125).</description><language>eng</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; MEASURING ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180808&amp;DB=EPODOC&amp;CC=GB&amp;NR=2559529A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180808&amp;DB=EPODOC&amp;CC=GB&amp;NR=2559529A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bernd W Gotsmann</creatorcontrib><creatorcontrib>Fabian Menges</creatorcontrib><creatorcontrib>Pio Peter Niraj Nirmalraj</creatorcontrib><title>Scanning probe sensor</title><description>A scanning probe sensor (100) for a scanning probe microscope (110) comprising a probe tip (120) having a ferromagnetic fluid (125) and a magnetic field generator (130) adapted to generate a magnetic field acting on the ferromagnetic fluid (125). Furthermore, a sensor controller (150) is provided and configured to control one or more parameters of the magnetic field generator (130), thereby controlling the shape of the fluid (125).</description><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SCANNING-PROBE TECHNIQUES OR APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBANTk7My8vMS1coKMpPSlUoTs0rzi_iYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXx7k5GpqaWpkaWjsaEVQAA94AgVQ</recordid><startdate>20180808</startdate><enddate>20180808</enddate><creator>Bernd W Gotsmann</creator><creator>Fabian Menges</creator><creator>Pio Peter Niraj Nirmalraj</creator><scope>EVB</scope></search><sort><creationdate>20180808</creationdate><title>Scanning probe sensor</title><author>Bernd W Gotsmann ; Fabian Menges ; Pio Peter Niraj Nirmalraj</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2559529A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SCANNING-PROBE TECHNIQUES OR APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Bernd W Gotsmann</creatorcontrib><creatorcontrib>Fabian Menges</creatorcontrib><creatorcontrib>Pio Peter Niraj Nirmalraj</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bernd W Gotsmann</au><au>Fabian Menges</au><au>Pio Peter Niraj Nirmalraj</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Scanning probe sensor</title><date>2018-08-08</date><risdate>2018</risdate><abstract>A scanning probe sensor (100) for a scanning probe microscope (110) comprising a probe tip (120) having a ferromagnetic fluid (125) and a magnetic field generator (130) adapted to generate a magnetic field acting on the ferromagnetic fluid (125). Furthermore, a sensor controller (150) is provided and configured to control one or more parameters of the magnetic field generator (130), thereby controlling the shape of the fluid (125).</abstract><oa>free_for_read</oa></addata></record>
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subjects APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
title Scanning probe sensor
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T16%3A03%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Bernd%20W%20Gotsmann&rft.date=2018-08-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EGB2559529A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true