Beam dumper for particle counter

Beam dumper for particle counter

A beam dumper for a particle counter includes an installation plate 207; a detector 203 mounted on the plate, comprising a photodiode 290 which receives excitation light; a housing 210 assembled with the detector, arranged in the path of non-scattering light of the excitation light, with a chamber 2...

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Hauptverfasser: Young-Su Jeong, Ki-Bong Choi, Eu-Gene Chong
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator Young-Su Jeong
Ki-Bong Choi
Eu-Gene Chong
description A beam dumper for a particle counter includes an installation plate 207; a detector 203 mounted on the plate, comprising a photodiode 290 which receives excitation light; a housing 210 assembled with the detector, arranged in the path of non-scattering light of the excitation light, with a chamber 211 that guides the nonscattering light; a control circuit that measures intensity of the non-scattering light on the photodiode, calculates beam loss generated due to the optical path to detect actual intensity of the excitation light, and controls the intensity of the excitation light; a beam guide 205 with a beam stopper 230 that prevents a portion of the non-scattering light from returning to a condensation-inducing path, a beam dumper lens 270; and a beam hole structure 201 into which non-scattering light reflected from the photodiode is guided.
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a control circuit that measures intensity of the non-scattering light on the photodiode, calculates beam loss generated due to the optical path to detect actual intensity of the excitation light, and controls the intensity of the excitation light; a beam guide 205 with a beam stopper 230 that prevents a portion of the non-scattering light from returning to a condensation-inducing path, a beam dumper lens 270; and a beam hole structure 201 into which non-scattering light reflected from the photodiode is guided.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20170301&amp;DB=EPODOC&amp;CC=GB&amp;NR=2541804A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20170301&amp;DB=EPODOC&amp;CC=GB&amp;NR=2541804A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Young-Su Jeong</creatorcontrib><creatorcontrib>Ki-Bong Choi</creatorcontrib><creatorcontrib>Eu-Gene Chong</creatorcontrib><title>Beam dumper for particle counter</title><description>A beam dumper for a particle counter includes an installation plate 207; 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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Beam dumper for particle counter
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