Commissioning field devices in a process control system supported by big data
Techniques for determining device-specific information such as commissioning data, location information, images, and other data descriptive of a process device installed in a plant include obtaining the device-specific information at a local device during the process device's commissioning. Bas...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Terrence Lynn Blevins Paul Richard Muston Mark John Nixon Daniel Dean Christensen Ken Beoughter Wilhelm K Wojsznis |
description | Techniques for determining device-specific information such as commissioning data, location information, images, and other data descriptive of a process device installed in a plant include obtaining the device-specific information at a local device during the process device's commissioning. Based on this information, the local device determines the relative order of the process device within a process flow, and may determine a process element alignment map indicating the activation order of a plurality of process elements within the flow. A user may modify the map at the local device. The map is transmitted to a process control big data network for use in discovery and learning analytics. The device-specific information and/or the map may be utilized to generate, at the local device, representations/views of the process flow, which may include real-time operational data. A user may zoom in or out on these views for more or less detail. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2536339B</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2536339B</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2536339B3</originalsourceid><addsrcrecordid>eNqFyrEKwjAURuEuDqI-g_8LuBgUXFuqLm7uJU1uy4UkN-RGoW-vg7vT-Yazbh6dxMiqLInTjIkpeHh6syMFJ1jkIl8rnKRaJEAXrRShr5ylVPIYF4w8w9tqt81qskFp9-um2V_7Z3c_UJaBNFtHiepwa48nczbm0pr_xwcdRjVw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Commissioning field devices in a process control system supported by big data</title><source>esp@cenet</source><creator>Terrence Lynn Blevins ; Paul Richard Muston ; Mark John Nixon ; Daniel Dean Christensen ; Ken Beoughter ; Wilhelm K Wojsznis</creator><creatorcontrib>Terrence Lynn Blevins ; Paul Richard Muston ; Mark John Nixon ; Daniel Dean Christensen ; Ken Beoughter ; Wilhelm K Wojsznis</creatorcontrib><description>Techniques for determining device-specific information such as commissioning data, location information, images, and other data descriptive of a process device installed in a plant include obtaining the device-specific information at a local device during the process device's commissioning. Based on this information, the local device determines the relative order of the process device within a process flow, and may determine a process element alignment map indicating the activation order of a plurality of process elements within the flow. A user may modify the map at the local device. The map is transmitted to a process control big data network for use in discovery and learning analytics. The device-specific information and/or the map may be utilized to generate, at the local device, representations/views of the process flow, which may include real-time operational data. A user may zoom in or out on these views for more or less detail.</description><language>eng</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210707&DB=EPODOC&CC=GB&NR=2536339B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210707&DB=EPODOC&CC=GB&NR=2536339B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Terrence Lynn Blevins</creatorcontrib><creatorcontrib>Paul Richard Muston</creatorcontrib><creatorcontrib>Mark John Nixon</creatorcontrib><creatorcontrib>Daniel Dean Christensen</creatorcontrib><creatorcontrib>Ken Beoughter</creatorcontrib><creatorcontrib>Wilhelm K Wojsznis</creatorcontrib><title>Commissioning field devices in a process control system supported by big data</title><description>Techniques for determining device-specific information such as commissioning data, location information, images, and other data descriptive of a process device installed in a plant include obtaining the device-specific information at a local device during the process device's commissioning. Based on this information, the local device determines the relative order of the process device within a process flow, and may determine a process element alignment map indicating the activation order of a plurality of process elements within the flow. A user may modify the map at the local device. The map is transmitted to a process control big data network for use in discovery and learning analytics. The device-specific information and/or the map may be utilized to generate, at the local device, representations/views of the process flow, which may include real-time operational data. A user may zoom in or out on these views for more or less detail.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqFyrEKwjAURuEuDqI-g_8LuBgUXFuqLm7uJU1uy4UkN-RGoW-vg7vT-Yazbh6dxMiqLInTjIkpeHh6syMFJ1jkIl8rnKRaJEAXrRShr5ylVPIYF4w8w9tqt81qskFp9-um2V_7Z3c_UJaBNFtHiepwa48nczbm0pr_xwcdRjVw</recordid><startdate>20210707</startdate><enddate>20210707</enddate><creator>Terrence Lynn Blevins</creator><creator>Paul Richard Muston</creator><creator>Mark John Nixon</creator><creator>Daniel Dean Christensen</creator><creator>Ken Beoughter</creator><creator>Wilhelm K Wojsznis</creator><scope>EVB</scope></search><sort><creationdate>20210707</creationdate><title>Commissioning field devices in a process control system supported by big data</title><author>Terrence Lynn Blevins ; Paul Richard Muston ; Mark John Nixon ; Daniel Dean Christensen ; Ken Beoughter ; Wilhelm K Wojsznis</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2536339B3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>Terrence Lynn Blevins</creatorcontrib><creatorcontrib>Paul Richard Muston</creatorcontrib><creatorcontrib>Mark John Nixon</creatorcontrib><creatorcontrib>Daniel Dean Christensen</creatorcontrib><creatorcontrib>Ken Beoughter</creatorcontrib><creatorcontrib>Wilhelm K Wojsznis</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Terrence Lynn Blevins</au><au>Paul Richard Muston</au><au>Mark John Nixon</au><au>Daniel Dean Christensen</au><au>Ken Beoughter</au><au>Wilhelm K Wojsznis</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Commissioning field devices in a process control system supported by big data</title><date>2021-07-07</date><risdate>2021</risdate><abstract>Techniques for determining device-specific information such as commissioning data, location information, images, and other data descriptive of a process device installed in a plant include obtaining the device-specific information at a local device during the process device's commissioning. Based on this information, the local device determines the relative order of the process device within a process flow, and may determine a process element alignment map indicating the activation order of a plurality of process elements within the flow. A user may modify the map at the local device. The map is transmitted to a process control big data network for use in discovery and learning analytics. The device-specific information and/or the map may be utilized to generate, at the local device, representations/views of the process flow, which may include real-time operational data. A user may zoom in or out on these views for more or less detail.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_GB2536339B |
source | esp@cenet |
subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
title | Commissioning field devices in a process control system supported by big data |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T01%3A26%3A00IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Terrence%20Lynn%20Blevins&rft.date=2021-07-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EGB2536339B%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |