Electronic circuit having serial latch scan chains

Disclosed is an electronic circuit 10 with latch scan chains 12, the circuit has a built-in test structure 14, generation means 16 that simultaneously generates scan-in data for each of the scan chains, and interception means 18 that intercepts test lines 20 of the scan chains. The test lines having...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CEDRIC LICHTENAU, JENS KUENZER, TILMAN GLOEKLER, ANDREAS KOENIG
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!