Methods and apparatus to apply multiple trip limits to a device in a process control system

Methods and apparatus to apply multiple trip limits to a device in a process control system are disclosed. An example method involves monitoring a value of a parameter associated with the operation of the device and receiving an input indicative of an operational state of the device, where a first i...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KEITH RICHARD BELLVILLE, DAVID MARK SMITH, GODFREY R SHERRIFF, GARY KEITH LAW
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TARIFF METERING APPARATUS TESTING
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