Optical emission eystem including dichroic beam combiner
An optical emission spectrometer system 100 (200,fig 3) includes a light source 101 and a dichroic beam combiner 130. The light source emits first light 115 in a first direction and second light 125 in a second direction different from the first direction. The dichroic beam combiner receives the fir...
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creator | LINDSAY BUCK GLYN RUSSELL MICHAEL BOLLES YIN SHENG SUN |
description | An optical emission spectrometer system 100 (200,fig 3) includes a light source 101 and a dichroic beam combiner 130. The light source emits first light 115 in a first direction and second light 125 in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path 110 and the second light via a second light path 120, reflects a portion the first light into an entrance aperture 145 of a light detection and measurement apparatus 140, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2501802A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2501802A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2501802A3</originalsourceid><addsrcrecordid>eNrjZLDwLyjJTE7MUUjNzSwuzszPU0itLC5JzVXIzEvOKU3JzEtXSMlMzijKz0xWSEpNzFVIzs9NysxLLeJhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkamBoYWBkaOxoRVAAB2Qi2f</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Optical emission eystem including dichroic beam combiner</title><source>esp@cenet</source><creator>LINDSAY BUCK ; GLYN RUSSELL ; MICHAEL BOLLES ; YIN SHENG SUN</creator><creatorcontrib>LINDSAY BUCK ; GLYN RUSSELL ; MICHAEL BOLLES ; YIN SHENG SUN</creatorcontrib><description>An optical emission spectrometer system 100 (200,fig 3) includes a light source 101 and a dichroic beam combiner 130. The light source emits first light 115 in a first direction and second light 125 in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path 110 and the second light via a second light path 120, reflects a portion the first light into an entrance aperture 145 of a light detection and measurement apparatus 140, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.</description><language>eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131106&DB=EPODOC&CC=GB&NR=2501802A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131106&DB=EPODOC&CC=GB&NR=2501802A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LINDSAY BUCK</creatorcontrib><creatorcontrib>GLYN RUSSELL</creatorcontrib><creatorcontrib>MICHAEL BOLLES</creatorcontrib><creatorcontrib>YIN SHENG SUN</creatorcontrib><title>Optical emission eystem including dichroic beam combiner</title><description>An optical emission spectrometer system 100 (200,fig 3) includes a light source 101 and a dichroic beam combiner 130. The light source emits first light 115 in a first direction and second light 125 in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path 110 and the second light via a second light path 120, reflects a portion the first light into an entrance aperture 145 of a light detection and measurement apparatus 140, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDwLyjJTE7MUUjNzSwuzszPU0itLC5JzVXIzEvOKU3JzEtXSMlMzijKz0xWSEpNzFVIzs9NysxLLeJhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkamBoYWBkaOxoRVAAB2Qi2f</recordid><startdate>20131106</startdate><enddate>20131106</enddate><creator>LINDSAY BUCK</creator><creator>GLYN RUSSELL</creator><creator>MICHAEL BOLLES</creator><creator>YIN SHENG SUN</creator><scope>EVB</scope></search><sort><creationdate>20131106</creationdate><title>Optical emission eystem including dichroic beam combiner</title><author>LINDSAY BUCK ; GLYN RUSSELL ; MICHAEL BOLLES ; YIN SHENG SUN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2501802A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LINDSAY BUCK</creatorcontrib><creatorcontrib>GLYN RUSSELL</creatorcontrib><creatorcontrib>MICHAEL BOLLES</creatorcontrib><creatorcontrib>YIN SHENG SUN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LINDSAY BUCK</au><au>GLYN RUSSELL</au><au>MICHAEL BOLLES</au><au>YIN SHENG SUN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Optical emission eystem including dichroic beam combiner</title><date>2013-11-06</date><risdate>2013</risdate><abstract>An optical emission spectrometer system 100 (200,fig 3) includes a light source 101 and a dichroic beam combiner 130. The light source emits first light 115 in a first direction and second light 125 in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path 110 and the second light via a second light path 120, reflects a portion the first light into an entrance aperture 145 of a light detection and measurement apparatus 140, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS RADIATION PYROMETRY TESTING |
title | Optical emission eystem including dichroic beam combiner |
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