Surface measurement apparatus and method

A metrological apparatus has a mover (9) to carry out a measurement by effecting relative movement in a measurement direction between a workpiece support surface (16) and a stylus (11) such that the stylus is deflected as a stylus tip of the stylus follows surface variations along a measurement path...

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1. Verfasser:	DANIEL IAN MANSFIELD
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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creator	DANIEL IAN MANSFIELD
description	A metrological apparatus has a mover (9) to carry out a measurement by effecting relative movement in a measurement direction between a workpiece support surface (16) and a stylus (11) such that the stylus is deflected as a stylus tip of the stylus follows surface variations along a measurement path on a workpiece surface. A data processor is configured to determine a location of a centre of the stylus tip at measurement points along a measurement path on a surface of a workpiece, the stylus tip locations defining a stylus tip locus; and to determine a surface form of the surface being measured using the determined stylus tip locus.
format	Patent
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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	Surface measurement apparatus and method
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