Method for determining the path length of a sample and validating the measurement obtained

Method for determining the path length of a sample and validating the measurement obtained

A for traceably determining an unknown optical path length of a sample in an optical measuring device comprises the steps of: providing a drop analyzer connected to a standard spectrophotometer; providing a certified reference material contained in first and second closed high accuracy cuvettes; mea...

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Hauptverfasser: Nathan Hulme, John Hammond, Keith Hulme
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator Nathan Hulme
John Hammond
Keith Hulme
description A for traceably determining an unknown optical path length of a sample in an optical measuring device comprises the steps of: providing a drop analyzer connected to a standard spectrophotometer; providing a certified reference material contained in first and second closed high accuracy cuvettes; measuring absorbance of the certified reference material to obtain a first absorbance measurement for the first specified path length; measuring absorbance of the certified reference material for a second path length to obtain a second absorbance measurement; using a dropping device to drop a specified volume of the solvent on an optical surface so that the path length of the specified volume can be determined by reference to the first and second absorbance measurement; and using the dropping device to drop the same volume of sample as the specified volume of solvent on the optical measuring device.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Method for determining the path length of a sample and validating the measurement obtained
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