A method or system for identifying the resonance frequency of a probe resonating in plasma

A method of identifying the resonance frequency of a probe resonating in a plasma. The method comprising obtaining at a first time, a first response signal representative of a probe resonating in a plasma. Obtaining at a second later time, a second response signal representative of the probe resonat...

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Hauptverfasser:	SHANTANU KUMAR KARKARI, CEZAR GAMAN
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY PLASMA TECHNIQUE PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS
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creator	SHANTANU KUMAR KARKARI CEZAR GAMAN
description	A method of identifying the resonance frequency of a probe resonating in a plasma. The method comprising obtaining at a first time, a first response signal representative of a probe resonating in a plasma. Obtaining at a second later time, a second response signal representative of the probe resonating in a plasma, wherein a perturbation is applied while the second response signal is being obtained. The first and second response signals are then combined to eliminate common background noise. The perturbation applied can be to the plasma itself i.e. power, flow rate or pressure thereof, or to the probe e.g. variation in the voltage applied thereto.
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY PLASMA TECHNIQUE PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS
title	A method or system for identifying the resonance frequency of a probe resonating in plasma
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