TOF mass spectrometer for stigmatic imaging and associated method

The present invention is concerned with improving the focusing of ions having a particular mass to charge ratio by optimising the electric field for the focusing of ions having that particular mass to charge ratio. In particular, the stigmatic focusing of ions can be improved by adjusting a voltage...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	ANDREW BOWDLER
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY
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